74AC11620_09 Datasheet, PDF (1/7 Pages) Texas Instruments – OCTAL TRANSCEIVER WITH DUAL ENABLE

74AC11620
OCTAL BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS062A − JULY 1987 − REVISED APRIL 1993
• Flow-Through Architecture Optimizes PCB
Layout
• Center-Pin V_CC and GND Configurations
Minimize High-Speed Switching Noise
• EPIC  (Enhanced-Performance Implanted
CMOS) 1-µm Process
• 500-mA Typical Latch-Up Immunity at
125°C
• Package Options Include Plastic
Small-Outline Packages, and Standard
Plastic 300-mil DIPs
description
This octal bus transceiver is designed for
asynchronous communication between data
buses. The control function implementation allows
for maximum flexibility in timing.
DW OR NT PACKAGE
(TOP VIEW)
A1 1
A2 2
A3 3
A4 4
GND 5
GND 6
GND 7
GND 8
A5 9
A6 10
A7 11
A8 12
24 OEAB
23 B1
22 B2
21 B3
20 B4
19 V_CC
18 V_CC
17 B5
16 B6
15 B7
14 B8
13 OEBA
These devices transmit data from the A bus to the B bus or from the B bus to the A bus depending upon the
level at the output-enable (OEAB or OEBA) inputs. The output-enable inputs can be used to disable the device
so that the buses are effectively isolated.
The dual-enable configuration gives these devices the capability to store data by simultaneous enabling of
OEAB and OEBA. Each output reinforces its input in this transceiver configuration. Thus, when both control
inputs are enabled and all other data sources to the two sets of bus lines are at high impedance, both sets of
bus lines (16 in all) will remain at their last states. The 8-bit codes appearing on the two sets of buses will be
complementary for the 74AC11620.
The 74AC11620 is characterized for operation from − 40°C to 85°C.
FUNCTION TABLE
INPUTS
OEBA OEAB
OPERATION
L
L
B data to A bus
H
H
A data to B bus
H
L
Isolation
L
H
B data to A bus,
A data to B bus
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1993, Texas Instruments Incorporated
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