74ABTH182652APMG4 Datasheet, PDF (1/39 Pages) Texas Instruments – SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18ĆBIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D − AUGUST 1993 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE  Family of Testability Products
D Members of the Texas Instruments
Widebus  Family
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Include D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D B-Port Outputs of ’ABTH182652A Devices
Have Equivalent 25-Ω Series Resistors, So
No External Resistors Are Required
D State-of-the-Art EPIC-ΙΙB  BiCMOS Design
D One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
D SCOPE  Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Device Identification
− Even-Parity Opcodes
D Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings
SN54ABTH18652A, SN54ABTH182652A . . . HV PACKAGE
(TOP VIEW)
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V_CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61
10
60
11
59
12
58
13
57
14
56
15
55
16
54
17
53
18
52
19
51
20
50
21
49
22
48
23
47
24
46
25
45
26
44
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
1B4
1B5
1B6
GND
1B7
1B8
1B9
V_CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
NC − No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
Copyright  1996, Texas Instruments Incorporated
On products compliant to MILĆPRFĆ38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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