CD74FCT374 Datasheet, PDF (7/8 Pages) Texas Instruments – BiCMOS FCT Interface Logic, Octal D-Type Flip-Flop, Three-State

Test Circuits and Waveforms (Continued)
OTHER
OUTPUTS
OUTPUT
UNDER
TEST
V_OH
V_OL
V_OH
V_OHV
V_OLP
V_OL
NOTES:
10. V_OLP is measured with respect to a ground reference near the output under test. V_OHV is measured with respect to V_OH.
11. Input pulses have the following characteristics:
P_RR ≤ 1MHz, t_r = 2.5ns, t_f = 2.5ns, skew 1ns.
12. R.F. fixture with 700MHz design rules required. IC should be soldered into test board and bypassed with 0.1µF capacitor. Scope and
probes require 700MHz bandwidth.
FIGURE 6. SIMULTANEOUS SWITCHING TRANSIENT WAVEFORMS
8-7