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SN54ABTH18652A Datasheet, PDF (6/37 Pages) Texas Instruments – SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18-BIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D – AUGUST 1993 – REVISED JULY 1996
Terminal Functions
TERMINAL NAME
1A1–1A9,
2A1– 2A9
1B1–1B9,
2B1– 2B9
1CLKAB, 1CLKBA,
2CLKAB, 2CLKBA
DESCRIPTION
Normal-function A-bus I/O ports. See function table for normal-mode logic.
Normal-function B-bus I/O ports. See function table for normal-mode logic.
Normal-function clock inputs. See function table for normal-mode logic.
GND
1OEAB, 2OEAB
Ground
Normal-function active-high output enables. See function table for normal-mode logic. An internal pulldown at each
terminal forces the terminal to a high level if left unconnected.
1OEBA, 2OEBA
Normal-function active-low output enables. See function table for normal-mode logic. An internal pullup at each terminal
forces the terminal to a high level if left unconnected.
1SAB, 1SBA,
2SAB, 2SBA
TCK
Normal-function select controls. See function table for normal-mode logic.
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
TDO
TMS
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
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