LMX5251_15 Datasheet, PDF (6/40 Pages) Texas Instruments – LMX5251 Bluetooth™ CMOS Radio

LMX5251
SNOSCW3A – FEBRUARY 2004 – REVISED APRIL 2013
ELECTRICAL SPECIFICATIONS
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GENERAL SPECIFICATIONS
The ABSOLUTE MAXIMUM RATINGS table indicate limits beyond which damage to the device may occur. The
RECOMMENDED OPERATING CONDITIONS table indicate conditions for which the device is intended to be
functional, but do not specify specific performance limits.
This device is a high performance RF integrated circuit and is ESD sensitive. Handling and assembly of this
device should be performed at ESD free workstations.
The following conditions are true unless otherwise stated in the tables below:
• T_A = –40°C to +85°C
• VDD_ANA_IN and VDD_DIG_IN = 3.3V
• RF system performance specifications are specified on Texas Instruments Dallas Board rev 2.0a reference
design platform.
• Reference Dallas Board rev 2.0a schematic for test point references.
ABSOLUTE MAXIMUM RATINGS
VDD_ANA_IN
VDD_DIG_IN
VDD_XXXXX
V_I
PinRF
T_S
T_L
T_NOPBL
ESD-HBM
ESD-MM
Analog LDO voltage input
Digital LDO voltage input
All other power supply voltage inputs
Voltage on any pin with GND = 0V
RF Input power
Storage temperature range
Lead temperature (solder 4 sec)
No Pb lead temperature (solder 4 sec)
ESD – Human Body Model
ESD – Machine Model
(1) A 2000V ESD rating applies to all pins except VDD_IF1(pin 6) = 1500V.
MIN
MAX UNIT
–0.2
3.6 V
–0.2
3.6 V
–0.2
2.75 V
–0.2 VDD + 0.2 V
+15 dBm
–65
+150 °C
+235 °C
+260 °C
2000 ⁽¹⁾
V
200 V
6
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