TPS51317_15 Datasheet, PDF (5/28 Pages) Texas Instruments – 3.3-V/5-V Input, 6-A, D-CAP+™ Mode Synchronous Step-Down Integrated FETs Converter

TPS51317
www.ti.com
SLUSAH9 – MARCH 2011
ELECTRICAL CHARACTERISTICS (continued)
over recommended free-air temperature range, V_V5IN = 5.0 V, PGND = GND (unless otherwise noted)
PARAMETER
CONDITIONS
MIN
TIMERS: ON-TIME, MINIMUM OFF-TIME, SS, AND I/O TIMINGS
V_VIN = 5 V, V_VOUT = 1.05 V, f_SW = 860 KHz
t_ONESHOTC
PWM one-shot ⁽²⁾
V_VIN = 5 V, V_VOUT = 1.05 V, f_SW = 1 MHz
V_VIN = 5 V, V_VOUT = 1.05 V, f_SW = 1.2 MHz
V_VIN = 5 V, V_VOUT = 1.05 V, f_SW = 1.5 MHz
t_MIN(off)
Minimum OFF time
V_VIN = 5 V, V_VOUT = 1.05 V, f_SW = 1 MHz, DRVL on, SW =
PGND, V_VOUT < V_REFIN
t_INT(SS)
Soft-start time
From EN = HI to VOUT =95%, default setting
t_INT(SSDLY)
Internal soft-start delay time
From EN = HI to VOUT ramp starts
t_PGDDLY
PGOOD startup delay time
External tracking
t_PGDPDLYH
PGOOD high propagation delay time 50 mV over drive, rising edge
0.8
t_PGDPDLYL
PGOOD low propagation delay time 50 mV over drive, falling edge
t_OVPDLY
OVP delay time
Time from the VOUT pin out of +20% of REFIN to OVP fault
t_UVDLYEN
Undervoltage fault enable delay
Time from EN_INT going high to undervoltage fault is ready
External tracking from VOUT ramp starts
t_UVPDLY
UVP delay time
LOGIC PINS: I/O VOLTAGE AND CURRENT
Time from the VOUT pin out of –30% of REFIN to UVP fault
V_PGDPD
PGOOD pull-down voltage
PGOOD low impedance, I_SINK = 4 mA, V_V5IN = 4.5 V
I_PGDLKG
PGOOD leakage current
PGOOD high impedance, forced to 5.5 V
–1
V_ENH
EN logic high
EN, VCCP logic
2
V_ENL
EN logic low
EN, VCCP logic
I_EN
EN input current
Threshold 1
80
Threshold 2
200
V_MODETH
MODE threshold voltage⁽³⁾
Threshold 3
370
Threshold 4
1.77
I_MODE
MODE current
(2) Ensured by design, not production tested.
(3) See Table 4 for descriptions of MODE parameters.
TYP MAX UNIT
240
210
ns
175
140
360
ns
1.6
ms
260
µs
8
ms
1
1.2 ms
10
µs
10
µs
2
ms
8
256
µs
0.3 V
0
1 µA
V
0.5 V
1 µA
130
180
250
300 mV
420
470
1.80 1.85 V
15
µA
Copyright © 2011, Texas Instruments Incorporated
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