SN75HVD08 Datasheet, PDF (5/17 Pages) Texas Instruments – WIDE SUPPLY RANGE RS-485 TRANSCEIVER

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SN75HVD08, SN65HVD08
SLLS550C – NOVEMBER 2002 – REVISED JULY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
Input
Generator ^VI
V_CC
DE
A
D
50 Ω ^B
V_OD
R_L = 54 Ω
± 1%
C_L = 50 pF ±20%
C_L Includes Fixture
and Instrumentation
Capacitance
V_I
1.5 V
3V
1.5 V
t_PLH
V_OD
0V
10%
t_r
t_PHL
90% 90%
t_f
≈2 V
0V
10%
≈ –2 V
Generator: PRR = 500 kHz, 50% Duty Cycle, t_r <6 ns, t_f <6 ns, Z_o = 50 Ω
Figure 3. Driver Switching Test Circuit and Voltage Waveforms
Input
Generator
D
3V
A
S1
B
DE
C_L = 50 pF ±20%
V_{I 50 Ω CL Includes Fixture}
and Instrumentation
Capacitance
V_O
R_L = 110 Ω
± 1%
V_I
t_PZH
V_O
Generator: PRR = 500 kHz, 50% Duty Cycle, t_r <6 ns, t_f <6 ns, Z_o = 50 Ω
1.5 V
2.3 V
t_PHZ
3V
1.5 V
0V
0.5 V
V_OH
≈0V
Figure 4. Driver High-Level Enable and Disable Time Test Circuit and Voltage Waveforms
3V
Input
Generator
3V ^D
A
S1
B
DE
C_L = 50 pF ±20%
V_{I 50 Ω}
C_L Includes Fixture
and Instrumentation
Capacitance
R_L = 110 Ω
± 1%
V_O
V_I
t_PZL
V_O
1.5 V
t_PLZ
2.3 V
1.5 V
≈3 V
0V
≈3 V
0.5 V
V_OL
Generator: PRR = 500 kHz, 50% Duty Cycle, t_r <6 ns, t_f <6 ns, Z_o = 50 Ω
Figure 5. Driver Low-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
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