LP3995_15 Datasheet, PDF (5/28 Pages) Texas Instruments – LP3995 Micropower 150-mA CMOS Voltage Regulator With Active Shutdown

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LP3995
SNVS179F – FEBRUARY 2003 – REVISED SEPTEMBER 2015
6.4 Thermal Information
THERMAL METRIC⁽¹⁾
LP3995
YZR (DSBGA) NGD (WSON)
UNIT
R_θJA ⁽²⁾
R_θJC(top)
R_θJB
ψ_JT
ψ_JB
R_θJC(bot)
Junction-to-ambient thermal resistance, High-K
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
5 PINS
181.2
0.8
107.9
0.5
107.9
N/A
6 PINS
68.5 ⁽³⁾
71.8
35.2
1.4
35.0
8.1
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) Thermal resistance value R_θJA is based on the EIA/JEDEC High-K printed circuit board defined by: JESD51-7 - High Effective Thermal
Conductivity Test Board for Leaded Surface Mount Packages.
(3) The PCB for the NGD (WSON) package R_θJA includes two (2) thermal vias under the exposed thermal pad per EIA/JEDEC JESD51-5.
6.5 Electrical Characteristics
Unless otherwise noted, V_EN = 1.5 V, V_IN = V_OUT + 1 V, C_IN = 1 µF, I_OUT = 1 mA, C_OUT = 1 µF, C_BYPASS = 0.01 µF. Typical
(TYP) values and limits apply for T_J = 25°C; minimum (MIN) and maximum (MAX) apply over the full temperature range for
operation, −40 to +125°C, unless otherwise specified in the Test Conditions. ⁽¹⁾⁽²⁾
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
V_IN
Input voltage
DEVICE OUTPUT: 1.5 ≤ V_OUT < 1.8V
Output voltage tolerance
ΔV_OUT
PSRR
Line regulation error
Load regulation error, DSBGA
Load regulation error, WSON
Power supply rejection ratio⁽³⁾
DEVICE OUTPUT: 1.8 V ≤ V_OUT < 2.5 V
Output voltage tolerance
ΔV_OUT
PSRR
Line regulation error, DSBGA
Line regulation error, WSON
Load regulation error, DSBGA
Load regulation error, WSON
Power supply rejection ratio⁽³⁾
I_OUT = 1 mA, T_J = 25°C
I_OUT = 1 mA
V_IN = (V_OUT(NOM)+1 V) to 6V,
I_OUT = 1 mA
I_OUT = 1 mA to 150 mA
I_OUT = 1 mA to 150 mA
ƒ = 1 kHz, I_OUT = 1 mA
ƒ = 10 kHz, I_OUT = 1 mA
I_OUT = 1 mA, T_J = 25°C
I_OUT = 1 mA
V_IN = (V_OUT(NOM)+1 V) to 6 V,
I_OUT = 1 mA
V_IN = (V_OUT(NOM)+1 V) to 6 V
I_OUT = 1 mA
I_OUT = 1 mA to 150 mA
I_OUT = 1 mA to 150 mA
ƒ = 1 kHz, I_OUT = 1 mA
ƒ = 10 kHz, I_OUT = 1 mA
2.5
6
V
–50
50
mV
–75
75
–3.5
3.5
µV/mA
10
75
µV/mA
70
125
µV/mA
55
dB
53
–50
50
mV
–75
75
–2.5
2.5
mV/V
–3.5
3.5
mV/V
10
75
µV/mA
80
125
µV/mA
55
dB
50
(1) All limits are ensured. All electrical characteristics having room-temperature limits are tested during production at T_J = 25°C or correlated
using Statistical Quality Control methods. Operation over the temperature specification is specified by correlating the electrical
characteristics to process and temperature variations and applying statistical process control.
(2) V_OUT(NOM) is the stated output voltage option for the device.
(3) This electrical specification is ensured by design.
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