CY54FCT240T Datasheet, PDF (5/11 Pages) Texas Instruments – 8-BIT BUFFERS/LINE DRIVERS WITH 3-STATE OUTPUTS

CY54FCT240T, CY74FCT240T
8-BIT BUFFERS/LINE DRIVERS
WITH 3-STATE OUTPUTS
SCCS017A – MAY 1994 – REVISED OCTOBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
CY54FCT240T
MIN TYP^† MAX
CY74FCT240T
MIN TYP^† MAX ^UNIT
VIK
VOH
VOL
Vhys
II
IIH
IIL
IOZH
IOZL
IOS^‡
Ioff
VCC = 4.5 V,
VCC = 4.75 V,
VCC = 4.5 V,
VCC = 4.75 V
VCC = 4.5 V,
VCC = 4.75 V,
All inputs
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC ₌ 5.5 V,
VCC ₌ 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 5.5 V,
VCC = 5.25 V,
VCC = 0 V,
IIN = –18 mA
IIN = –18 mA
IOH = –12 mA
IOH = –32 mA
IOH = –15 mA
IOL = 48 mA
IOL = 64 mA
VIN = VCC
VIN = VCC
VIN = 2.7 V
VIN = 2.7 V
VIN = 0.5 V
VIN = 0.5 V
VOUT = 2.7 V
VOUT = 2.7 V
VOUT = 0.5 V
VOUT = 0.5 V
VOUT = 0 V
VOUT = 0 V
VOUT = 4.5 V
–0.7 –1.2
2.4 3.3
0.3 0.55
0.2
5
±1
±1
10
–10
–60 –120 –225
±1
V
–0.7 –1.2
2
V
2.4 3.3
V
0.3 0.55
0.2
V
µA
5
µA
±1
µA
±1
µA
10
µA
–10
mA
–60 –120 –225
±1 µA
ICC
∆ICC
VCC = 5.5 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
VCC = 5.5 V, VIN = 3.4 V^§, f1 = 0, Outputs open
VCC = 5.25 V, VIN = 3.4 V^§, f1 = 0, Outputs open
0.1 0.2
0.5
2
mA
0.1 0.2
mA
0.5
2
ICCD^¶
VCC = 5.5 V, One input switching at 50% duty cycle,
Outputs open, OEA = OEB = GND,
VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
VCC = 5.25 V, One input switching at 50% duty cycle,
Outputs open, OEA = OEB = GND,
VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.06 0.12
mA/
MHz
0.06 0.12
† _{Typical values are at VCC = 5 V, TA = 25°C.}
‡ _{Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or}
sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence
of parameter tests, IOS tests should be performed last.
§ _{Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND}
¶ _{This parameter is derived for use in total power-supply calculations.}
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