TL507C Datasheet, PDF (4/8 Pages) Texas Instruments – ANALOG-TO-DIGITAL CONVERTER

TL507C, TL507l
ANALOG-TO-DIGITAL CONVERTER
SLAS041 – OCTOBER 1979 – REVISED OCTOBER 1988
output section
IOH
IOL
VOL
PARAMETER
High-level output current
Low-level output current
Low-level output voltage
TEST CONDITIONS
VOH = 18 V
VOL = 5.5 V
IOL = 1.6 mA
MIN TYP†
0.1
5
10
80
MAX
100
15
400
UNIT
µA
mA
mV
operating characteristics over recommended operating free-air temperature range,
V_CC1 = V_CC2 = 5.12 V
PARAMETER
TEST CONDITIONS
MIN TYP†
Overall error
Differential nonlinearity
Zero error‡
See Figure 1
Binary count = 0
Scale error
Full scale input voltage‡
Binary count =127
Binary count = 127
3.74 3.82
Propagation delay time from RESET or ENABLE
2
† _{All typical values are at TA = 25°C.}
‡ _{These parameters are linear functions of VCC1.}
MAX
± 80
± 20
± 80
± 80
3.9
UNIT
mV
mV
mV
mV
V
µs
definitions
zero error
The absolute value of the difference between the actual analog voltage at the 01H-to-00H transition and the
ideal analog voltage at that transition.
overall error
The magnitude of the deviation from a straight line between the endpoints of the transfer function.
differential nonlinearity
The maximum deviation of an analog-value change associated with a 1-bit code change (1 clock pulse) from
its theoretical value of 1 LSB.
4
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