TL317_15 Datasheet, PDF (4/22 Pages) Texas Instruments – 3-TERMINAL ADJUSTABLE REGULATOR

TL317
SLVS004H – APRIL 1979 – REVISED OCTOBER 2011
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ELECTRICAL CHARACTERISTICS
over recommended operating virtual-junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS⁽¹⁾
MIN
Input voltage regulation⁽²⁾
Ripple regulation
V_I – V_O = 5 V to 35 V
T_J = 25°C
I_{O =} 2.5 mA to 100 mA
V_O = 10 V,
f = 120 Hz
V_O = 10 V,
10-µF capacitor between ADJUSTMENT and
66
ground
Output voltage regulation
Output voltage change with temperature
Output voltage long-term drift
Output noise voltage
Minimum output current to maintain
regulation
V_I = 5 V to 35 V,
I_O = 2.5 mA to 100 mA,
T_J = 25°C
V_O ≤ 5 V
V_O ≥ 5 V
V_I = 5 V to 35 V,
I_O = 2.5 mA to 100 mA
V_O ≤ 5
V_O ≥ 5 V
T_J = 0°C to 125°C
After 1000 hours at T_J = 125°C and V_I – V_O = 35 V
f = 10 Hz to 10 kHz,
T_J = 25°C
V_I – V_O = 35
Peak output current
V_I – V_O ≤ 35 V
100
ADJUSTMENT current
Change in ADJUSTMENT current
V_I – V_O = 2.5 V to 35 V, I_O = 2.5 mA to 100 mA
Reference voltage (output to
ADJUSTMENT)
V_I − V_O = 5 V to 35 V, I_O = 2.5 mA to 100 mA,
1.2
P ≤ rated dissipation
TYP
MAX UNIT
0.01
0.02
%V
0.02
0.05
65
dB
80
25
mV
5
mV/V
50
mV
10
mV/V
10
mV/V
3
10 mV/V
30
µV/V
1.5
2.5 mA
200
mA
50
100 µA
0.2
5 µA
1.25
1.3 V
(1) Unless otherwise noted, these specifications apply for the following test conditions: V_I – V_O = 5 V and I_O = 40 mA. Pulse-testing
techniques must be used that maintain the junction temperature as close to the ambient temperature as possible. All characteristics are
measured with a 0.1-μF capacitor across the input and a 1-µF capacitor across the output.
(2) Input voltage regulation is expressed here as the percentage change in output voltage per 1-V change at the input.
4
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