SN54ABTH16244 Datasheet, PDF (4/7 Pages) Texas Instruments – 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS

SN54ABTH16244, SN74ABTH16244
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS677D – SEPTEMBER 1996 – REVISED MARCH 2000
recommended operating conditions (see Note 3)
SN54ABTH16244 SN74ABTH16244
UNIT
MIN MAX
MIN MAX
VCC
VIH
VIL
VI
IOH
IOL
∆t/∆v
Supply voltage
High-level input voltage
Low-level input voltage
Input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Outputs enabled
4.5
5.5
2
0.8
0 VCC
–24
48
10
4.5
5.5 V
2
V
0.8 V
0 VCC V
–32 mA
64 mA
10 ns/V
TA
Operating free-air temperature
–55
125
–40
85 °C
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABTH16244 SN74ABTH16244
MIN TYP† MAX
MIN MAX
MIN MAX
VIK
VOH
VOL
Vhys
II
II(hold)
IOZH
IOZL
Ioff
ICEX
IO‡
ICC
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5 V,
VCC = 4.5 V
VCC = 4.5 V
II = –18 mA
IOH = –3 mA
IOH = –3 mA
IOH = –24 mA
IOH = –32 mA
IOL = 48 mA
IOL = 64 mA
VCC = 5.5 V,
VCC = 4.5 V
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 0,
VCC = 5.5 V,
VO = 5.5 V
VCC = 5.5 V,
VCC = 5.5 V,
IO = 0,
VI = VCC or GND
VI = VCC or GND
VI = 0.8 V
VI = 2 V
VO = 2.7 V
VO = 0.5 V
VI or VO ≤ 4.5 V
Outputs high
VO = 2.5 V
Outputs high
Outputs low
Outputs disabled
–1.2
2.5
3
2
2*
0.55
0.55*
100
±1
100
–40
10
–10
±100
50
–50 –100 –180
3
32
3
–1.2
2.5
3
2
0.55
±1
100
–40
10
–10
50
–50 –180
3
32
3
–1.2
2.5
3
2
0.55
±1
100
–40
10
–10
±100
50
–50 –180
3
32
3
∆ICC§
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
1.5
1.5
1.5
Ci
VI = 2.5 V or 0.5 V
3
Co
VO = 2.5 V or 0.5 V
8
* On products compliant to MIL-PRF-38535, this parameter does not apply.
† _{All typical values are at VCC = 5 V.}
‡ _{Not more than one output should be tested at a time, and the duration of the test should not exceed one second.}
§ _{This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.}
UNIT
V
V
V
mV
µA
µA
µA
µA
µA
µA
mA
mA
mA
pF
pF
4
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