SN54ABT8543 Datasheet, PDF (4/25 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
Terminal Functions
TERMINAL
NAME
A1–A8
B1–B8
CEAB, CEBA
GND
LEAB, LEBA
OEAB, OEBA
TCK
TDI
TDO
TMS
VCC
DESCRIPTION
Normal-function A-bus I/O ports. See function table for normal-mode logic.
Normal-function B-bus I/O ports. See function table for normal-mode logic.
Normal-function chip-enable inputs. See function table for normal-mode logic.
Ground
Normal-function latch-enable inputs. See function table for normal-mode logic.
Normal-function output-enable inputs. See function table for normal-mode logic.
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK, and outputs change on the falling edge of TCK.
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
Supply voltage
4
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