MAX202 Datasheet, PDF (4/14 Pages) Texas Instruments – 5-V DUAL RS-232 LINE DRIVER/RECEIVER WITH +-15KV ESD PROTECTION

MAX202
5ĆV DUAL RSĆ232 LINE DRIVER/RECEIVER
WITH ±15ĆkV ESD PROTECTION
SLLS576D − JULY 2003 − REVISED JANUARY 2004
DRIVER SECTION
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Note 4 and Figure 4)
PARAMETER
TEST CONDITIONS
MIN TYP† MAX UNIT
VOH
VOL
IIH
IIL
IOS‡
High-level output voltage
Low-level output voltage
High-level input current
Low-level input current
Short-circuit output current
DOUT at RL = 3 kΩ to GND,
DOUT at RL = 3 kΩ to GND,
VI = VCC
VI at 0 V
VCC = 5.5 V,
DIN = GND
DIN = VCC
VO = 0 V
5
9
V
−5
−9
V
15 200 µA
−15 −200 µA
±10 ±60 mA
ro
Output resistance
VCC, V+, and V− = 0 V,
VO = ±2 V
300
W
† _{All typical values are at VCC = 5 V, and TA = 25°C.}
‡ _{Short-circuit durations should be controlled to prevent exceeding the device absolute power-dissipation ratings, and not more than one output}
should be shorted at a time.
NOTE 4: Test conditions are C1−C4 = 0.1 µF at VCC = 5 V ± 0.5 V.
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Note 4 and Figure 4)
PARAMETER
Maximum data rate
tPLH _(D)
Propagation delay time,
low- to high-level output
TEST CONDITIONS
CL = 50 to1000 pF,
One DOUT switching,
RL = 3 kΩ to 7 kΩ,
See Figure 1
CL = 2500 pF,
All drivers loaded,
RL = 3 kΩ,
See Figure 1
MIN TYP† MAX UNIT
120
kbit/s
2
µs
Propagation delay time,
tPHL _{(D) high- to low-level output}
CL = 2500 pF,
All drivers loaded,
RL = 3 kΩ,
See Figure 1
2
µs
tsk(p)
Pulse skew§
CL = 150 pF to 2500 pF, RL = 3 kΩ to 7 kΩ,
See Figure 2
300
ns
SR(tr)
Slew rate, transition region
(see Figure 1)
CL = 50 pF to 1000 pF,
VCC = 5 V
RL = 3 kΩ to 7 kΩ,
† _{All typical values are at VCC = 5 V, and TA = 25°C.}
§ _{Pulse skew is defined as |tPLH − tPHL| of each channel of the same device.}
NOTE 4: Test conditions are C1−C4 = 0.1 µF at VCC = 5 V ± 0.5 V.
3
6
30 V/µs
ESD protection
PIN
DOUT, RIN
Human-Body Model
TEST CONDITIONS
TYP UNIT
±15 kV
4
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