CD54HC20 Datasheet, PDF (4/9 Pages) Texas Instruments – High-Speed CMOS Logic Dual 4-Input NAND Gate

CD54HC20, CD74HC20, CD54HCT20, CD74HCT20
DC Electrical Specifications (Continued)
PARAMETER
Quiescent Device
Current
TEST
CONDITIONS
25^oC
SYMBOL V_I (V) I_O (mA) V_CC (V) MIN
I_CC
V_CC or
0
GND
6
-
TYP MAX
-
2
-40^oC TO 85^oC
MIN MAX
-
20
HCT TYPES
High Level Input
Voltage
V_IH
-
-
4.5 to 2
-
-
2
-
5.5
Low Level Input
Voltage
V_IL
-
-
4.5 to -
- 0.8
-
0.8
5.5
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
V_OH
V_IH or -0.02
4.5
4.4
-
-
4.4
-
V_IL
-4
4.5 3.98 -
-
3.84
-
Low Level Output
Voltage
CMOS Loads
V_OL
V_IH or 0.02
4.5
-
- 0.1
-
0.1
V_IL
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
4
4.5
-
- 0.26
-
0.33
I_I
V_CC
0
5.5
-
and
GND
±0.1
-
±1
Quiescent Device
Current
I_CC
V_CC or
0
5.5
-
-
2
-
20
GND
Additional Quiescent
∆I_CC
V_CC
-
4.5 to - 100 360
-
450
Device Current Per
(Note 2) -2.1
5.5
Input Pin: 1 Unit Load
NOTE:
2. For dual-supply systems theoretical worst case (V_I = 2.4V, V_CC = 5.5V) specification is 1.8mA.
-55^oC TO 125^oC
MIN MAX UNITS
-
40
µA
2
-
V
-
0.8
V
4.4
-
V
3.7
-
V
-
0.1
V
-
0.4
V
-
±1
µA
-
40
µA
-
490
µA
HCT Input Loading Table
INPUT
UNIT LOADS
All
0.15
NOTE: Unit Load is
Specifications table,
∆_{e.IgC.C3l6im0µ}itAspmeacxifieadt _2in5oDCC.
Electrical
Switching Specifications Input t_r, t_f = 6ns
PARAMETER
TEST
V_CC
25^oC
-40^oC TO 85^oC -55^oC TO 125^oC
SYMBOL CONDITIONS (V) MIN TYP MAX MIN MAX MIN MAX UNITS
HC TYPES
Propagation Delay, Input to
t_PLH, t_PHL C_L = 50pF
2
-
- 100
-
125
-
150
ns
Output (Figure1)
4.5 -
-
20
-
25
-
30
ns
6
-
- 17
-
21
-
26
ns
Propagation Delay, Data Input to t_PLH, t_PHL C_L = 15pF
5
-8
-
-
-
-
-
ns
Output Y
4