MSP430X41X_11 Datasheet, PDF (37/64 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430x41x
MIXED SIGNAL MICROCONTROLLER
SLAS340J − MAY 2001 − REVISED DECEMBER 2008
electrical characteristics over recommended operating free-air temperature (unless otherwise
noted) (continued)
flash memory
PARAMETER
TEST
CONDITIONS
V_CC
MIN TYP MAX UNIT
V_CC(PGM/
ERASE)
f_FTG
I_PGM
I_ERASE
t_CPT
t_CMErase
Program and erase supply voltage
Flash timing generator frequency
Supply current from DV_CC during program
Supply current from DV_CC during erase
Cumulative program time
Cumulative mass erase time
Program/erase endurance
See Note 1
See Note 2
2.7
3.6 V
257
476 kHz
2.7 V/ 3.6 V
3
5 mA
2.7 V/ 3.6 V
3
7 mA
2.7 V/ 3.6 V
10 ms
2.7 V/ 3.6 V 200
ms
10⁴ 10⁵
cycles
t_Retention
Data retention duration
T_J = 25°C
100
years
t_Word
Word or byte program time
35
t_{Block, 0}
Block program time for 1^st byte or word
30
t_{Block, 1-63}
t_{Block, End}
t_{Mass Erase}
Block program time for each additional byte or word
Block program end-sequence wait time
Mass erase time
See Note 3
21
6
5297
t_FTG
t_{Seg Erase}
Segment erase time
4819
NOTES: 1. The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
2. The mass erase duration generated by the flash timing generator is at least 11.1 ms ( = 5297x1/f_FTG,max = 5297x1/476kHz). To
achieve the required cumulative mass erase time the flash controller’s mass erase operation can be repeated until this time is met.
(A worst case minimum of 19 cycles are required).
3. These values are hardwired into the flash controller’s state machine (t_FTG = 1/f_FTG).
JTAG interface
PARAMETER
TEST
CONDITIONS
V_CC
f_TCK
TCK input frequency
see Note 1
2.2 V
3V
R_Internal
Internal pull-up resistance on TMS, TCK, TDI/TCLK see Note 2
2.2 V/ 3 V
NOTES: 1. f_TCK may be restricted to meet the timing requirements of the module selected.
2. TMS, TDI/TCLK, and TCK pullup resistors are implemented in all versions.
MIN TYP MAX UNIT
0
5 MHz
0
10 MHz
25
60
90 kΩ
JTAG fuse (see Note 1)
PARAMETER
TEST
CONDITIONS
MIN MAX UNIT
V_CC(FB)
V_FB
Supply voltage during fuse-blow condition
Voltage level on TDI/TCLK for fuse-blow
T_A = 25°C
MSP430C41x
MSP430F41x
2.5
V
3.5 3.9 V
6
7V
I_FB
Supply current into TDI/TCLK during fuse blow
100 mA
t_FB
Time to blow fuse
1 ms
NOTES: 1. Once the fuse is blown, no further access to the MSP430 via JTAG/Test is possible. The JTAG block is switched to bypass mode.
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