TLC5615C_15 Datasheet, PDF (3/23 Pages) Texas Instruments – 10-BIT DIGITAL-TO-ANALOG CONVERTERS

TLC5615C, TLC5615I
www.ti.com
SLAS142E – OCTOBER 1996 – REVISED JUNE 2007
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)⁽¹⁾
Supply voltage (V_DD to AGND)
Digital input voltage range to AGND
Reference input voltage range to AGND
Output voltage at OUT from external source
Continuous current at any terminal
Operating free-air temperature range, T_A
TLC5615C
TLC5615I
Storage temperature range, T_stg
Lead temperature 1,6mm (1/16 inch) from case for 10 seconds
UNIT
7V
–0.3V to V_DD + 0.3V
–0.3V to V_DD + 0.3V
V_DD + 0.3V
±20mA
0°C to +70°C
–40°C to +85°C
–65°C to +150°C
+260°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Supply voltage, V_DD
High-level digital input voltage, V_IH
Low-level digital input voltage, V_IL
Reference voltage, V_ref to REFIN terminal
Load resistance, R_L
Operating free-air temperature, T_A
TLC5615C
TLC5615I
MIN NOM
4.5
5
2.4
2 2.048
2
0
40
MAX
5.5
0.8
V_DD–2
70
85
UNIT
V
V
V
V
kΩ
°C
°C
ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range, V_DD = 5V ± 5%, V_ref = 2.048V (unless otherwise noted)
STATIC DAC SPECIFICATIONS
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Resolution
Integral nonlinearity, end point adjusted (INL)
Differential nonlinearity (DNL)
E_ZS Zero-scale error (offset error at zero scale)
Zero-scale-error temperature coefficient
E_G
Gain error
Gain-error temperature coefficient
PSRR Power-supply rejection ratio
Zero scale
Gain
V_ref = 2.048V,
V_ref = 2.048V,
V_ref = 2.048V,
V_ref = 2.048V,
V_ref = 2.048V,
V_ref = 2.048V,
See ^{(7) (8)}
See ⁽¹⁾
See ⁽²⁾
See ⁽³⁾
See ⁽⁴⁾
See ⁽⁵⁾
See ⁽⁶⁾
10
±0.1
3
1
80
80
bits
±1 LSB
±0.5 LSB
±3 LSB
ppm/°C
±3 LSB
ppm/°C
dB
Analog full scale output
R_L = 100kΩ
2V_ref(1023/1024)
V
(1) The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output from
the line between zero and full scale excluding the effects of zero code and full-scale errors (see text). Tested from code 3 to code 1024.
(2) The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1LSB
amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant)
as a change in the digital input code. Tested from code 3 to code 1024.
(3) Zero-scale error is the deviation from zero-voltage output when the digital input code is zero (see text).
(4) Zero-scale-error temperature coefficient is given by: E_ZS TC = [E_ZS (T_max) – E_ZS (T_min)]/V_ref × 10⁶/(T_max– T_min).
(5) Gain error is the deviation from the ideal output (V_ref – 1LSB) with an output load of 10kΩ excluding the effects of the zero-scale error.
(6) Gain temperature coefficient is given by: E_G TC = [E_G(T_max) – E_G (T_min)]/V_ref × 10⁶/(T_max– T_min).
(7) Zero-scale-error rejection ratio (EZS-RR) is measured by varying the V_DD from 4.5V to 5.5V dc and measuring the proportion of this
signal imposed on the zero-code output voltage.
(8) Gain-error rejection ratio (EG-RR) is measured by varying the V_DD from 4.5V to 5.5V dc and measuring the proportion of this signal
imposed on the full-scale output voltage after subtracting the zero-scale change.
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