SN74AUP1G07 Datasheet, PDF (3/12 Pages) Texas Instruments – LOW-POWER SINGLE BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS

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Absolute Maximum Ratings⁽¹⁾
over operating free-air temperature range (unless otherwise noted)
SN74AUP1G07
LOW-POWER SINGLE BUFFER/DRIVER
WITH OPEN-DRAIN OUTPUTS
SCES591A – JULY 2004 – REVISED JULY 2005
V_CC
Supply voltage range
V_I
Input voltage range⁽²⁾
V_O
Voltage range applied to any output in the high-impedance or power-off state⁽²⁾
V_O
Voltage range applied to any output in the high or low state⁽²⁾
I_IK
Input clamp current
V_I < 0
I_OK
Output clamp current
V_O < 0
I_O
Continuous output current
Continuous current through V_CC or GND
DBV package
θ_JA
Package thermal impedance⁽³⁾
DCK package
YEP/YZP package
T_stg
Storage temperature range
MIN
MAX
–0.5
4.6
–0.5
4.6
–0.5
4.6
–0.5 V_CC + 0.5
–50
–50
±20
±50
206
252
132
–65
150
UNIT
V
V
V
V
mA
mA
mA
mA
°C/W
°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The package thermal impedance is calculated in accordance with JESD 51-7.
Recommended Operating Conditions⁽¹⁾
V_CC Supply voltage
V_IH High-level input voltage
V_IL
Low-level input voltage
V_I
Input voltage
V_O
Output voltage
I_OL
Low-level output current⁽²⁾
∆t/∆v Input transition rise or fall rate
T_A
Operating free-air temperature
V_CC = 0.8 V
V_CC = 1.1 V to 1.95 V
V_CC = 2.3 V to 2.7 V
V_CC = 3 V to 3.6 V
V_CC = 0.8 V
V_CC = 1.1 V to 1.95 V
V_CC = 2.3 V to 2.7 V
V_CC = 3 V to 3.6 V
V_CC = 0.8 V
V_CC = 1.1 V
V_CC = 1.4 V
V_CC = 1.65 V
V_CC = 2.3 V
V_CC = 3 V
V_CC = 0.8 V to 3.6 V
MIN
MAX
0.8
3.6
V_CC
0.65 × V_CC
1.6
2
0
0.35 × V_CC
0.7
0.9
0
3.6
0
3.6
20
1.1
1.7
1.9
3.1
4
200
–40
85
UNIT
V
V
V
V
V
µA
mA
ns/V
°C
(1) All unused inputs of the device must be held at V_CC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
(2) Defined by the signal integrity requirements and design-goal priorities.
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