SM74501_15 Datasheet, PDF (3/10 Pages) Texas Instruments – SM74501 Ultra-Low Quiescent Current LDO Voltage Regulator

SM74501
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SNVS721B – JUNE 2011 – REVISED APRIL 2013
Electrical Characteristics for SM74501–3.3 (continued)
V_IN = 14V, I_O = 10 mA, T_J = 25°C, unless otherwise specified. Boldface limits apply over entire operating temperature range
Parameter
Conditions
Min
Typical
Max
(1)
(2)
(1)
Units
Output Voltage with
Reverse Polarity Input
Maximum Line Transient
Output Bypass
Capacitance (C_OUT) ESR
V_IN = −15V, R_L = 500Ω
R_L = 500Ω, V_O ≤ 3.63V, T = 40ms
C_OUT = 22µF
0.1mA ≤ I_OUT ≤ 50mA
0.00
−0.30
V
60
V
0.3
8
Ω
Electrical Characteristics for SM74501–5.0
V_IN = 14V, I_O = 10 mA, T_J = 25°C, unless otherwise specified. Boldface limits apply over entire operating temperature range
Parameter
Conditions
Min
Typical
Max
(1)
(2)
(1)
Units
SM74501–5.0
Output Voltage
Quiescent Current
Line Regulation
Load Regulation
Dropout Voltage
Short Circuit Current
Output Impedance
Output Noise Voltage
Long Term Stability
Ripple Rejection
Reverse Polarity
Transient Input Voltage
Output Voltage with
Reverse Polarity Input
Maximum Line Transient
Output Bypass
Capacitance (C_OUT) ESR
5.5V ≤ V_IN ≤ 26V,
100 µA ≤ I_O ≤ 50 mA ⁽³⁾
I_O = 100 μA, 8V ≤ V_IN ≤ 24V
I_O = 10 mA, 8V ≤ V_IN ≤ 24V
I_O = 50 mA, 8V ≤ V_IN ≤ 24V
9V ≤ V_IN ≤ 16V
6V ≤ V_IN ≤ 40V, I_O = 1 mA
100 μA ≤ I_O ≤ 5 mA
5 mA ≤ I_O ≤ 50 mA
I_O = 100 μA
I_O = 50 mA
V_O = 0V
I_O = 30 mAdc and 10 mArms,
f ^{= 1000 Hz}
10 Hz–100 kHz
V_ripple = 1V_rms, _fripple = 120 Hz
R_L = 500Ω, T = 1 ms
V_IN = −15V, R_L = 500Ω
R_L = 500Ω, V_O ≤ 5.5V, T = 40ms
C_OUT = 10µF
0.1mA ≤ I_OUT ≤ 50mA
4.90
5.00
5.10
4.85
5.00
5.15
V
9
15
μA
0.20
0.50
mA
1.5
2.5
mA
5
10
mV
10
30
10
30
mV
10
30
0.05
0.10
V
0.20
0.40
V
65
120
250
mA
450
mΩ
500
20
−40
−60
−50
−80
μV
mV/1000 Hr
dB
V
0.00
−0.30
V
60
V
0.3
8
Ω
(1) Datasheet min/max specification limits are specified by design, test, or statistical analysis.
(2) Typicals are at 25°C (unless otherwise specified) and represent the most likely parametric norm.
(3) To ensure constant junction temperature, pulse testing is used.
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