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LMV796_15 Datasheet, PDF (3/30 Pages) Texas Instruments – LMV796/LMV796Q/LMV797 17 MHz, Low Noise, CMOS Input, 1.8V Operational Amplifiers
LMV796, LMV797
www.ti.com
SNOSAU9D – MARCH 2006 – REVISED MARCH 2013
2.5V Electrical Characteristics (continued)
Unless otherwise specified, all limits are specified for TA = 25°C, V+ = 2.5V, V− = 0V, VCM = V+/2 = VO. Boldface limits apply
at the temperature extremes.
Symbol
Parameter
Conditions
Min
(1)
Typ
(2)
Max
(1)
Units
CMRR Common Mode Rejection Ratio
PSRR Power Supply Rejection Ratio
CMVR Common Mode Voltage Range
AVOL Open Loop Voltage Gain
VOUT
Output Voltage Swing High
Output Voltage Swing Low
IOUT
Output Current
IS
Supply Current per Amplifier
SR
Slew Rate
GBW
en
in
THD+N
Gain Bandwidth
Input Referred Voltage Noise Density
Input Referred Current Noise Density
Total Harmonic Distortion + Noise
0V ≤ VCM ≤ 1.4V
2.0V ≤ V+ ≤ 5.5V, VCM = 0V
1.8V ≤ V+ ≤ 5.5V, VCM = 0V
CMRR ≥ 60 dB
CMRR ≥ 55 dB
LMV796/LMV796Q
VOUT = 0.15V to 2.2V,
RLOAD = 2 kΩ to V+/2 LMV797
VOUT = 0.15V to 2.2V,
RLOAD = 10 kΩ to V+/2
RLOAD = 2 kΩ to V+/2
RLOAD = 10 kΩ to V+/2
RLOAD = 2 kΩ to V+/2
RLOAD = 10 kΩ to V+/2
Sourcing to V−
VIN = 200 mV(6)
Sinking to V+
VIN = –200 mV(6)
LMV796/LMV796Q
LMV797
per channel
AV = +1, Rising (10% to 90%)
AV = +1, Falling (90% to 10%)
f = 1 kHz
f = 1 kHz
f = 1 kHz, AV = 1, RLOAD = 600Ω
80
75
80
75
80
−0.3
-0.3
85
80
82
78
88
84
35
28
7
5
94
100
98
98
92
110
25
20
30
15
47
15
0.95
1.1
8.5
10.5
14
6.2
0.01
0.01
dB
dB
1.5
1.5
V
dB
75
82
65
71 mV from
75 either rail
78
65
67
mA
1.30
1.65
mA
1.50
1.85
V/μs
MHz
nV/√Hz
pA/√Hz
%
(6) The short circuit test is a momentary test, the short circuit duration is 1.5ms.
5V Electrical Characteristics
Unless otherwise specified, all limits are specified for TA = 25°C, V+ = 5V, V− = 0V, VCM = V+/2 = VO. Boldface limits apply at
the temperature extremes.
Symbol
Parameter
Conditions
Min
(1)
Typ
(2)
Max
(1)
Units
VOS
Input Offset Voltage
TC VOS Input Offset Voltage Temperature Drift
LMV796/LMV796Q (3)
LMV797 (3)
0.1 ±1.35
±1.65
mV
−1.0
μV/°C
−1.8
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
statistical quality control (SQC) method.
(2) Typical values represent the parametric norm at the time of characterization.
(3) Offset voltage average drift is determined by dividing the change in VOS by temperature change.
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