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LMH2120_15 Datasheet, PDF (3/34 Pages) Texas Instruments – LMH2120 6 GHz Linear RMS Power Detector with 40 dB Dynamic Range
LMH2120
www.ti.com
SNWS021C – JULY 2010 – REVISED FEBRUARY 2013
2.7 V and 4.5V DC and AC Electrical Characteristics
Unless otherwise specified, all limits are ensured to TA = 25°C, VDD = 2.7V and 4.5V (worst case of the 2 is specified), RFIN=
1900 MHz CW (Continuous Wave, unmodulated). Boldface limits apply at the temperature extremes (1).
Symbol
Parameter
Condition
Min
Typ
Max
Units
(2)
(3)
(2)
Supply Interface
IDD
Supply Current
Active mode: EN = High, no signal
present at RFIN.
Shutdown: EN = LOW,
no signal present at
RFIN
VBAT = 2.7V
VBAT = 4.5V
2.9
3.5
4.0
mA
3.8
4.7
5.0
µA
4.7
5.7
6.1
EN = LOW, RFIN = 0
dBm, 1900 MHz
VBAT = 2.7V
VBAT = 4.5V
3.8
4.7
5.0
µA
4.7
5.7
6.1
PSRR
Power Supply Rejection Ratio
RFIN = -10 dBm, 1900 MHz, 2.7V <
VBAT < 5V
50
60
dB
Logic Enable Interface
VLOW
EN logic LOW input level
(Shutdown mode)
VHIGH
EN logic HIGH input level
IEN
Current into EN pin
Input / Output Interface
0.6
V
1.1
50
nA
RIN
VOUT
Input Resistance
Minimum Output Voltage
(Pedestal)
No Input Signal
44
50
56
Ω
18
29
33
mV
ROUT
IOUT
Output Resistance
Output Sinking Current
Output Sourcing Current
EN = HIGH, RFIN = -10 dBm, 1900
MHz, ILOAD = 1 mA, DC measurement
1
2
3
Ω
RFIN = -10 dBm, 1900 MHz, OUT
connected to 2.5V
30
25
42
mA
RFIN = -10 dBm, 1900 MHz, OUT
connected to GND
36
31
45
IOUT, SD
en
Output Leakage Current in
Shutdown Mode
Output Referred Noise (4)
EN = LOW, OUT connected to 2V
RFIN = -10 dBm, 1900 MHz, output
spectrum at 10 kHz
80
nA
5
µV/√Hz
vn
Output Referred Noise Integrated Integrated over frequency band 1 kHz -
(4)
6.5 kHz, RFIN = -10 dBm, 1900 MHz
390
Timing Characteristics
µVRMS
tON
Turn-on Time from shutdown
RFIN = -10 dBm, 1900 MHz, EN LOW-
to-HIGH transition to OUT at 90%
13
18
µs
tR
Rise Time
Signal at RFIN from -20 dBm to 0 dBm,
10% to 90%, 1900 MHz
7
µs
tF
Fall Time
Signal at RFIN from 0 dBm to -20 dBm,
90% to 10%, 1900 MHz
18
µs
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where TJ > TA.
(2) All limits are ensured by test or statistical analysis.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) This parameter is ensured by design and/or characterization and is not tested in production.
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