CY74FCT16501T Datasheet, PDF (3/8 Pages) Texas Instruments – 18-Bit Registered Transceivers

CY74FCT16501T
CY74FCT162501T
CY74FCT162H501T
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min. Typ.^[8] Max. Unit
V_IH
Input HIGH Voltage
V_IL
Input LOW Voltage
V_H
Input Hysteresis^[9]
V_IK
Input Clamp Diode Voltage
I_IH
Input HIGH Current
Standard
Bus Hold
V_CC=Min., I_IN=−18 mA
V_CC=Max., V_I=V_CC
2.0
V
0.8
V
100
mV
−0.7 −1.2
V
±1
µA
±100
I_IL
I_BBH
I_BBL
I_BHHO
I_BHLO
I_OZH
Input LOW Current
Standard V_CC=Max., V_I=GND
Bus Hold
Bus Hold Sustain Current on Bus Hold Input^[10] V_CC=Min.,
V_I=2.0V −50
V_I=0.8V +50
Bus Hold Overdrive Current on Bus Hold In-
put^[10]
V_CC=Max., V_I=1.5V
High Impedance Output Current
(Three-State Output pins)
V_CC=Max., V_OUT=2.7V
±1
µA
±100 µA
µA
µA
TBD mA
±1
µA
I_OZL
High Impedance Output Current
(Three-State Output pins)
I_OS
Short Circuit Current^[11]
I_O
Output Drive Current^[11]
I_OFF
Power-Off Disable
V_CC=Max., V_OUT=0.5V
V_CC=Max., V_OUT=GND
V_CC=Max., V_OUT=2.5V
V_CC=0V, V_OUT≤4.5V^[12]
±1
µA
−80 −140 −200 mA
−50
−180 mA
±1
µA
Output Drive Characteristics for CY74FCT16501T
Parameter
Description
V_OH
Output HIGH Voltage
V_OL
Output LOW Voltage
Test Conditions
V_CC=Min., I_OH=−3 mA
V_CC=Min., I_OH=−15 mA
V_CC=Min., I_OH=−32 mA
V_CC=Min., I_OL=64 mA
Min.
2.5
2.4
2.0
Typ.^[8]
3.5
3.5
3.0
0.2
Max.
0.55
Unit
V
V
Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T
Parameter
Description
Test Conditions
Min. Typ.^[8] Max. Unit
I_ODL
I_ODH
Output LOW Current^[11]
Output HIGH Current^[11]
V_CC=5V, V_IN=V_IH or V_IL, V_OUT=1.5V
V_CC=5V, V_IN=V_IH or V_IL, V_OUT=1.5V
60
115 150 mA
−60 −115 −150 mA
V_OH
Output HIGH Voltage
V_CC=Min., I_OH=−24 mA
2.4
3.3
V
V_OL
Output LOW Voltage
V_CC=Min., I_OL=24 mA
0.3
0.55
V
Notes:
8. Typical values are at V_CC= 5.0V, T_A= +25˚C ambient.
9. This parameter is specified but not tested.
10. Pins with bus hold are described in Pin Description.
11. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I_OS tests should be performed last.
12. Tested at +25˚C.
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