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BQ24314 Datasheet, PDF (3/13 Pages) Texas Instruments – OVERVOLTAGE AND OVERCURRENT PROTECTION IC AND Li+ CHARGER FRONT-END PROTECTION IC
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NAME
ILIM
TERMINAL
DSJ
9
DSG
7
CE
7
5
FAULT
4
4
VSS
NC
3
2
5, 6, 12 3
Thermal
PAD
bq24314
bq24316
SLUS763 – JULY 2007
I/O
DESCRIPTION
I/O Input overcurrent threshold programming. Connect a resistor to VSS to set the overcurrent
threshold.
I Chip enable input. Active low. When CE = High, the input FET is off. Internally pulled down.
Open-drain output, device status. FAULT = Low indicates that the input FET has been turned off
O due to input overvoltage or input overcurrent conditions, or because the battery voltage is outside
safe limits.
– Ground terminal
These pins may have internal circuits used for test purposes. Do not make any external connections
at these pins for normal operation.
There is an internal electrical connection between the exposed thermal pad and the VSS pin of the
–
device. The thermal pad must be connected to the same potential as the VSS pin on the printed
circuit board. Do not use the thermal pad as the primary ground input for the device. The VSS pin
must be connected to ground at all times.
IN 1
VSS 2
NC 3
FAULT 4
bq24314DSG
bq24316DSG
8 OUT
7 ILIM
6 VBAT
5 CE
IN 1
IN 2
VSS 3
FAULT 4
NC 5
NC 6
bq24314DSJ
bq24316DSJ
12 NC
11 OUT
10 OUT
9 ILIM
8 VBAT
7 CE
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
Input voltage
Input current
Output current
Output sink current
Junction temperature, TJ
Storage temperature, TSTG
Lead temperature (soldering, 10 seconds)
PIN
IN (with respect to VSS)
OUT (with respect to VSS)
ILIM, FAULT, CE, VBAT (with respect to VSS)
IN
OUT
FAULT
VALUE
–0.3 to 30
–0.3 to 12
–0.3 to 7
2.0
2.0
15
–40 to 150
–65 to 150
300
UNIT
V
A
A
mA
°C
°C
°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage
values are with respect to the network ground terminal unless otherwise noted.
Copyright © 2007, Texas Instruments Incorporated
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