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BQ24085 Datasheet, PDF (3/34 Pages) Texas Instruments – 750 mA SINGLE-CHIP Li-Ion/Li-Pol CHARGE MANAGEMENT IC WITH THERMAL REGULATION
bq24085, bq24086
bq24087, bq24088
www.ti.com .................................................................................................................................................... SLUS784B – DECEMBER 2007 – REVISED MAY 2008
ELECTRICAL CHARACTERISTICS
over recommended operating range, TJ = 0 –125°C range, See the Application Circuits section, typical values at TJ = 25°C
(unless otherwise noted), RTMR = 49.9KΩ
PARAMETER
TEST CONDITIONS
POWER DOWN THRESHOLD – UNDERVOLTAGE LOCKOUT
UVLO
Power down threshold
V(IN) = 0 V, increase V(OUT): 0 → 3 V OR
V(OUT) = 0 V, increase V(IN): 0 → 3 V,
CE = LO (1)
tDGL(PG)
Deglitch time on power good
V(IN) = 0 V → 5 V in 1 µs to
PG:HI → LO
INPUT POWER DETECTION, CE = HI or LOW, V(IN) > 3.5 V
VIN(DT)
Input power detection threshold
V(IN) detected at [V(IN) – V(OUT)] > VIN(DT)
VHYS(INDT)
Input power detection hysteresis
Input power not detected at
[V(IN) – V(OUT)] < [VIN(DT) – VHYS(INDT)]
tDGL(NOIN)
Delay time, input power not detected
status (1)
PG: LO →HI after tDGL(NOIN)
tDLY(CHGOFF) Charger off delay
INPUT OVERVOLTAGE PROTECTION
Charger turned off after tDLY(CHGOFF), Measured
from PG: LO → HI; Timer reset after tDLY(CHGOFF)
V(OVP)
Input overvoltage detection threshold V(IN) increasing
bq24088
bq24085/6/7
VHYS(OVP)
Input overvoltage hysteresis
V(IN) decreasing
bq24088
bq24085/6/7
tDGL(OVDET) Input overvoltage detection delay
CE = HI or LO, Measured from V(IN) > V(OVP) to
PG: LO → HI; VIN increasing
tDGL(OVNDET) Input overvoltage not detected delay(1)
CE = HI or LO, Measured from V(IN) < V(OVP)
to PG: HI → LO; V(IN) decreasing
QUIESCENT CURRENT
ICC(CHGOFF)
ICC(CHGON)
IBAT(DONE)
IN pin quiescent current, charger off
IN pin quiescent current, charger on
Battery leakage current after termination
into IC
Input power detected,
CE = HI
V(IN) = 6 V
V(IN) = 16.5 V
Input power detected, CE = LO, VBAT = 4.5 V
Input power detected, charge terminated,
CE = LO
IBAT(CHGOFF)
Battery leakage current into IC, charger
off
Input power detected, CE = HI OR
input power not detected, CE = LO
TS PIN COMPARATOR
V(TS1)
V(TS2)
VHYS(TS)
CE INPUT
Lower voltage temperature threshold
Upper voltage temperature threshold
Hysteresis
Hot detected at V(TS) < V(TS1); NTC thermistor
Cold detected at V(TS) > V(TS2); NTC thermistor
Temp OK at V(TS) > [ V(TS1) + VHYS(TS) ] OR
V(TS) < [ V(TS2) – VHYS(TS) ]
VIL
Input (low) voltage
V(/CE)
VIH
Input (high) voltage
V(/CE)
STAT1, STAT2 AND PG OUTPUTS , V(IN) ≥ VO(REG) + V(DO-MAX)
VOL
Output (low) saturation voltage
Iout = 5 mA (sink)
THERMAL SHUTDOWN
T(SHUT)
T(SHUTHYS)
Temperature trip
Thermal hysteresis
Junction temperature, temp rising
Junction temperature
MIN
1.5
30
10.2
6.2
29
60
0
2
TYP
2
25
10.5
6.5
0.5
0.2
100
350
4
1
1
30
61
2
155
20
MAX UNIT
3V
ms
130 mV
mV
10 µs
ms
11.7
V
7
V
100 µs
100 µs
200
µA
6 mA
5 µA
5 µA
31 %V(IN)
62 %V(IN)
%V(IN)
1V
V
100 mV
°C
°C
(1) Specified by design, not production tested.
Copyright © 2007–2008, Texas Instruments Incorporated
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