5962-7802006QEA Datasheet, PDF (3/11 Pages) Texas Instruments – DS26LS32MQML Quad Differential Line Receivers

DS26LS32MQML
www.ti.com
SNOSAM6B – OCTOBER 2005 – REVISED APRIL 2013
Absolute Maximum Ratings ⁽¹⁾
Supply Voltage
Common-Mode Range
Differential Input Voltage
Enable Voltage
Output Sink Current
Maximum Power Dissipation at 25°C ⁽²⁾
NFE0016A Package
NAJ0020A Package
NAD0016A Package
Junction Temperature (T_J)
Thermal Resistance, Junction-to-Ambient θ_JA
NFE0016A Package
NAJ0020A Package
NAD0016A Package
Thermal Resistance, Junction-to-Ambient θ_JC
Storage Temperature Range
Lead Temperature (Soldering, 4 seconds)
ESD Tolerance ⁽³⁾
7V
±25V
±25V
7V
50 mA
1666.5 mW
1875 mW
967.74 mW
+150°C
100°C/W
130°C/W
140°C/W
See MIL-STD-1835
−65°C to +165°C
260°C
500V
(1) Absolute Maximum Ratings are those values beyond which the safety of the device cannot be verified. They are not meant to imply that
the device should be operated at these limits. The table of “Electrical Characteristics” provides conditions for actual device operation.
(2) Derate NFE0016A, package 11.11 mW/°C above 25°C; derate NAJ0020A package 12.5 mW/°C above 25°C; derate NAD0016A
Package 6.4516 mW/°C for above 25°C.
(3) Human body model, 1.5kΩ in series with 100pF.
Recommended Operating Conditions
Supply Voltage, V_CC
Temperature, T_A
4.5 V to 5.5 V
−55°C to +125°C
Quality Conformance Inspection
MIL-STD-883, Method 5005 - Group A
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp ( °C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
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