SN54ABT18502 Datasheet, PDF (28/29 Pages) Texas Instruments – SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

SN54ABT18502
SCAN TEST DEVICE WITH
18-BIT REGISTERED BUS TRANSCEIVER
SCBS109C – AUGUST 1992 – REVISED AUGUST 1994
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 50 pF
(see Note A)
500 Ω
500 Ω
7V
S1
Open
GND
TEST
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
S1
Open
7V
Open
LOAD CIRCUIT FOR OUTPUTS
tw
Input 1.5 V
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
Timing Input
3V
Data Input
0V
3V
1.5 V
0V
tsu
1.5 V
th
3V
1.5 V
0V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Input
(see Note B)
1.5 V
3V
1.5 V
0V
tPLH
Output
tPHL
Output
1.5 V
1.5 V
tPHL
VOH
1.5 V
VOL
tPLH
1.5 V
VOH
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
Output
Control
tPZL
Output
Waveform 1
S1 at 7 V
(see Note C)
Output
Waveform 2
S1 at Open
(see Note C)
tPZH
1.5 V
tPLZ
1.5 V
tPHZ
1.5 V
3V
1.5 V
0V
3.5 V
VOL + 0.3 V _VOL
VOH
VOH – 0.3 V
[0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. The outputs are measured one at a time with one transition per measurement.
Figure 13. Load Circuit and Voltage Waveforms
4–28
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