TLC27L1 Datasheet, PDF (25/32 Pages) Texas Instruments – LinCMOSE LOW-POWER OPERATIONAL AMPLIFIERS

TLC27L1, TLC27L1A, TLC27L1B
LinCMOS™ LOW-POWER
OPERATIONAL AMPLIFIERS
SLOS154 – DECEMBER 1995
APPLICATION INFORMATION
feedback
Operational amplifier circuits almost always
employ feedback, and since feedback is the first
prerequisite for oscillation, a little caution is
appropriate. Most oscillation problems result from
driving capacitive loads and ignoring stray input
capacitance. A small-value capacitor connected
in parallel with the feedback resistor is an effective
remedy (see Figure 42). The value of this
capacitor is optimized empirically.
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _VO
Figure 42. Compensation for Input
Capacitance
electrostatic discharge protection
The TLC27L1 incorporates an internal ESD protection circuit that prevents functional failures at voltages up to
2000 V as tested under MIL-STD-883C, Method 3015.2. Care should be exercised, however, when handling
these devices as exposure to ESD may result in the degradation of the device parametric performance. The
protection circuit also causes the input bias currents to be temperature dependent and have the characteristics
of a reverse-biased diode.
latch-up
Because CMOS devices are susceptible to latch-up due to their inherent parasitic thyristors, the TLC27L1 inputs
and output were designed to withstand – 100-mA surge currents without sustaining latch-up; however,
techniques should be used to reduce the chance of latch-up whenever possible. Internal protection diodes
should not by design be forward biased. Applied input and output voltage should not exceed the supply voltage
by more than 300 mV. Care should be exercised when using capacitive coupling on pulse generators. Supply
transients should be shunted by the use of decoupling capacitors (0.1 µF typical) located across the supply rails
as close to the device as possible.
The current path established when latch-up occurs is usually between the positive supply rail and ground and
can be triggered by surges on the supply lines and/or voltages on either the output or inputs that exceed the
supply voltage. Once latch-up occurs, the current flow is limited only by the impedance of the power supply and
the forward resistance of the parasitic thyristor and usually results in the destruction of the device. The chance
of latch-up occurring increases with increasing temperature and supply voltages.
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