TPS74201_15 Datasheet, PDF (2/28 Pages) Texas Instruments – 1.5A Ultra-LDO with Programmable Soft-Start

TPS742xx
SBVS064L – DECEMBER 2005 – REVISED NOVEMBER 2010
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
TPS742xx yyy z
ORDERING INFORMATION⁽¹⁾
V_OUT ⁽²⁾
XX is nominal output voltage (for example, 12 = 1.2V, 15 = 1.5V, 01 = Adjustable).⁽³⁾
YYY is package designator.
Z is package quantity.
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) Output voltages from 0.9V to 1.5V in 50mV increments and 1.5V to 3.3V in 100mV increments are available through the use of
innovative factory EEPROM programming; minimum order quantities may apply. Contact factory for details and availability.
(3) For fixed 0.8V operation, tie FB to OUT.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
At T_J = –40°C to +125°C, unless otherwise noted. All voltages are with respect to GND.
TPS742xx
V_IN, V_BIAS Input voltage range
V_EN Enable voltage range
V_PG Power-good voltage range
I_PG PG sink current
V_SS SS pin voltage range
V_FB Feedback pin voltage range
V_OUT Output voltage range
I_OUT Maximum output current
Output short circuit duration
–0.3 to +6
–0.3 to +6
–0.3 to +6
0 to +1.5
–0.3 to +6
–0.3 to +6
–0.3 to V_IN + 0.3
Internally limited
Indefinite
P_DISS Continuous total power dissipation
T_J Operating junction temperature range
T_STG Storage junction temperature range
See Thermal Information Table
–40 to +125
–55 to +150
UNIT
V
V
V
mA
V
V
V
°C
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these conditions is not implied. Exposure to absolute-maximum-rated conditions for
extended periods may affect device reliability.
2
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