SN74ABT18646 Datasheet, PDF (2/13 Pages) Texas Instruments – WITH 18-BIT TRANSCEIVER AND REGISTER

SN74ABT18646
SCAN TEST DEVICE
WITH 18-BIT TRANSCEIVER AND REGISTER
SCBS131A – AUGUST 1992 – REVISED JANUARY 2002
description (continued)
In the normal mode, this device is an 18-bit bus transceiver and register that allows for multiplexed transmission
of data directly from the input bus or from the internal registers. It can be used either as two 9-bit transceivers
or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data
appearing at the device pins or to perform a self-test on the boundary test cells. Activating the TAP in the normal
mode does not affect the functional operation of the SCOPE bus transceivers and registers.
Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the
transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR
is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both
buses.
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is
clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data
is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for
presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB
and SAB, respectively. Figure 1 illustrates the four fundamental bus-management functions that can be
performed with the SN74ABT18646.
In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can
perform boundary scan test operations according to the protocol described in IEEE Std 1149.1-1990.
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform
other testing functions, such as parallel signature analysis on data inputs and pseudorandom pattern generation
from data outputs. All testing and scan operations are synchronized to the TAP interface.
Additional flexibility is provided in the test mode through the use of two boundary scan cells (BSCs) for each
I/O pin. This allows independent test data to be captured and forced at either bus (A or B). A PSA/COUNT
instruction is also included to ease the testing of memories and other circuits where a binary count addressing
scheme is useful.
ORDERING INFORMATION
TA
PACKAGE^†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
–40°C to 85°C
LQFP – PM Tray
SN74ABT18646PM
ABT18646
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB}
design guidelines are available at www.ti.com/sc/package.
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