OPA2211-HT_15 Datasheet, PDF (2/22 Pages) Texas Instruments – 1.1 nV/√Hz Noise, Low Power, Precision Operational Amplifier

OPA2211-HT
SBOS684A – AUGUST 2013 – REVISED AUGUST 2013
INPUT VOLTAGE NOISE DENSITY vs FREQUENCY
100
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10
1
0.1
1
10
100
1k
10k
100k
Frequency (Hz)
Table 1. ORDERING INFORMATION⁽¹⁾
T_J
–55°C to 150°C
PACKAGE
PWP
ORDERABLE PART NUMBER
OPA2211SPWP
TOP-SIDE MARKING
OP2211S
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
Supply Voltage
Input Voltage
Input Current (Any pin except power-supply pins)
Output Short-Circuit⁽²⁾
Storage Temperature, (T_S)
Junction Temperature, (T_J)
ESD Ratings
Human Body Model (HBM)
Charged Device Model (CDM)
V_S = (V+) – (V–)
VALUE
40
(V–) – 0.5 to (V+) + 0.5
±10
Continuous
–65 to +165
–55 to +165
3000
1000
UNIT
V
V
mA
°C
°C
V
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Short-circuit to V_S/2 (ground in symmetrical dual supply setups), one amplifier per package.
2
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