LM4040-EP_15 Datasheet, PDF (2/10 Pages) Texas Instruments – PRECISION MICROPOWER SHUNT VOLTAGE REFERENCE

LM4040-EP
SLOS746A – SEPTEMBER 2011 – REVISED SEPTEMBER 2011
FUNCTIONAL BLOCK DIAGRAM
CATHODE
+
_
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ANODE
Absolute Maximum Ratings⁽¹⁾
over free-air temperature range (unless otherwise noted)
I_Z
Continuous cathode current
T_J
Operating virtual junction temperature
T_stg
Storage temperature range
MIN
MAX UNIT
–10
25 mA
150 °C
–65
150 °C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
THERMAL INFORMATION
THERMAL METRIC⁽¹⁾
θ_JA
Junction-to-ambient thermal resistance⁽²⁾
θ_JC
Junction-to-case thermal resistance
θ_JB
Junction-to-board thermal resistance⁽³⁾
ψ_JT
Junction-to-top characterization parameter⁽⁴⁾
ψ_JB
Junction-to-board characterization parameter⁽⁵⁾
LM4040
DBZ
3 PINS
320.8
98.2
53.3
3.3
51.8
UNITS
°C/W
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(4) The junction-to-top characterization parameter, ψ_JT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θ_JA, using a procedure described in JESD51-2a (sections 6 and 7).
(5) The junction-to-board characterization parameter, ψ_JB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θ_JA , using a procedure described in JESD51-2a (sections 6 and 7).
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