DAC8806_15 Datasheet, PDF (2/22 Pages) Texas Instruments – 14-Bit, Parallel Input Multiplying Digital-to-Analog Converternull

DAC8806
SBAS385B – APRIL 2006 – REVISED FEBRUARY 2008
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION⁽¹⁾
PRODUCT
DAC8806I
MINIMUM
RELATIVE
ACCURACY
(LSB)
±1
DIFFERENTIAL
NONLINEARITY
(LSB)
±1
PACKAGE-
LEAD
(DESIGNATOR)
DB-28 (SSOP)
SPECIFIED
TEMPERATURE
RANGE
–40°C to +85°C
PACKAGE
MARKING
DAC8806
ORDERING
NUMBER
DAC8806IDB
DAC8806IDBR
TRANSPORT MEDIA,
QUANTITY
Tubes, 48
Tape and Reel, 2000
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted)
V_DD to GND
Digital input voltage to GND
V (I_OUT) to GND
Operating temperature range
REF, R_OFS, R_FB, R1, R_COM to AGND, and DGND
Storage temperature range
Junction temperature range (T_J max)
Power dissipation
Thermal impedance, R_θJA
ESD rating
Human body model (HBM)
Charged device model (CDM)
DAC8806
–0.3 to +7
–0.3 to +V_DD + 0.3
–0.3 to +V_DD + 0.3
–40 to +85
±25
–65 to +150
+125
(T_J max – T_A)/R_θJA
55
4000
1000
UNIT
V
V
V
°C
V
°C
°C
W
°C/W
V
V
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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