DAC7821 Datasheet, PDF (2/18 Pages) Texas Instruments – 12-Bit, Parallel Input, Multiplying Digital-to-Analog Converter

DAC7821
SBAS365A – OCTOBER 2005 – REVISED FEBRUARY 2006
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION⁽¹⁾
PRODUCT
DAC7821
PACKAGE
PACKAGE DESIGNATOR
20-TSSOP
PW
DAC7821
20-QFN ⁽²⁾
RGP
SPECIFIED
TEMPERATURE
RANGE
–40°C to +125°C
–40°C to +125°C
PACKAGE
MARKING
DAC7821
DAC7821
ORDERING
NUMBER
DAC7821IPW
DAC7821IPWR
DAC7821IRGPT
DAC7821IRGPR
TRANSPORT MEDIA,
QUANTITY
70, Tube
2000, Tape and Reel
250, Tape and Reel
3000, Tape and Reel
(1) For the most current specifications and package information, see the Package Option Addendum located at the end of this data sheet or
refer to our web site at www.ti.com.
(2) Available 2Q 2006.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)⁽¹⁾
V_DD to GND
Digital input voltage to GND
V_OUT to GND
Operating temperature range
Storage temperature range
Junction temperature (T_J max)
ESD Rating, HBM
ESD Rating, CDM
DAC7821
–0.3 to +7.0
–0.3 to V_DD + 0.3
–0.3 to V_DD + 0.3
–40 to +125
–65 to +150
+150
3000
1000
UNIT
V
V
V
°C
°C
°C
V
V
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2