CY5474FCT374T Datasheet, PDF (2/9 Pages) Texas Instruments – 8-Bit Registers

CY54/74FCT374T
CY54/74FCT574T
Functional Description
Maximum Ratings^{[2, 3]}
The FCT374T and FCT574T are high-speed low-power octal
D-type flip-flops featuring separate D-type inputs for each
flip-flop. Both devices have three-state outputs for bus oriented
applications. A buffered clock (CP) and output enable (OE) are
common to all flip-flops. The FCT574T is identical to FCT374T
except for flow-through pinout to simplify board design. The
eight flip-flops contained in the FCT374T and FCT574T will
store the state of their individual D inputs that meet the set-up
and hold time requirements on the LOW-to-HIGH clock (CP)
transition. When OE is LOW, the contents of the eight flip-flops
are available at the outputs. When OE is HIGH, the outputs will
be in the high-impedance state. The state of output enable
does not affect the state of the flip-flops.
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
Function Table^[1]
Inputs
D
CP
OE
H
L
L
L
X
X
H
Outputs
O
H
L
Z
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................. -65°C to +150°C
Ambient Temperature with
Power Applied............................................. –65°C to +135°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Input Voltage ........................................... –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ...... 120 mA
Power Dissipation .......................................................... 0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range
Commercial
Military^[4]
Range
T, AT, CT
All
Ambient
Temperature
–40°C to +85°C
–55°C to +125°C
V_CC
5V ± 5%
5V ± 10%
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min. Typ.^[5] Max. Unit
V_OH
Output HIGH Voltage
V_CC=Min., I_OH=–32 mA
Com’l
2.0
V
V_CC=Min., I_OH=–15 mA
Com’l
2.4
3.3
V
V_CC=Min., I_OH=–12 mA
Mil
2.4
3.3
V
V_OL
Output LOW Voltage
V_CC=Min., I_OL=64 mA
Com’l
0.3 0.55
V
V_CC=Min., I_OL=32 mA
Mil
0.3 0.55
V
V_IH
Input HIGH Voltage
2.0
V
V_IL
Input LOW Voltage
V_H
Hysteresis^[6]
All inputs
0.8
V
0.2
V
V_IK
Input Clamp Diode Voltage
V_CC=Min., I_IN=–18 mA
–0.7 –1.2
V
I_I
Input HIGH Current
I_IH
Input HIGH Current
V_CC=Max., V_IN=V_CC
V_CC=Max., V_IN=2.7V
5
µA
±1
µA
I_IL
I_OZH
Input LOW Current
Off State HIGH-Level Output
Current
V_CC=Max., V_IN=0.5V
V_CC = Max., V_OUT = 2.7V
±1
µA
10
µA
I_OZL
Off State LOW-Level
Output Current
V_CC = Max., V_OUT = 0.5V
–10 µA
I_OS
Output Short Circuit Current^[7] V_CC=Max., V_OUT=0.0V
–60 –120 –225 mA
I_OFF
Power-Off Disable
V_CC=0V, V_OUT=4.5V
±1
µA
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level X = Don’t Care Z = HIGH Impedance = LOW-to-HIGH clock transition
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V_CC or ground.
4. T_A is the “instant on” case temperature.
5. Typical values are at V_CC=5.0V, T_A=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameters tests. In any sequence of parameter
tests, I_OS tests should be performed last.
2