CY5474FCT163T Datasheet, PDF (2/7 Pages) Texas Instruments – 4-Bit Binary Counter

CY54/74FCT163T
Function Table^[1]
Inputs
SR PE CET
L
X
X
H
L
X
H
H
H
H
H
L
H
H
X
CEP
X
X
H
X
L
Action on the Rising
Clock Edge(s)
Reset (Clear)
Load (P_n Q_n)
Count (Incremental)
No Charge (Hold)
No Charge (Hold)
Pin Description
Name
CEP
CET
CP
SR
P
PE
Q
TC
Description
Count Enable Parallel Input
Count Enable Trickle Input
Clock Pulse Input (Active Rising Edge)
Synchronous Reset Input (Active LOW)
Parallel Data Inputs
Parallel Enable Input (Active LOW)
Flip-Flop Outputs
Terminal Count Output
Maximum Ratings^[2,3]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ..................................... −65°C to +150°C
Ambient Temperature with
Power Applied .................................................. −65°C to +135°C
Supply Voltage to Ground Potential..................−0.5V to +7.0V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage ..............................................−0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ...... 120 mA
Power Dissipation .......................................................... 0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range
Commercial
Military^[4]
Range
All
All
Ambient
Temperature
−40°C to +85°C
−55°C to +125°C
V_CC
5V ± 5%
5V ± 10%
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min. Typ.^[5] Max. Unit
V_OH
Output HIGH Voltage
V_CC=Min., I_OH=−32 mA
Com’l
2.0
V
V_CC=Min., I_OH=−15 mA
Com’l
2.4
3.3
V
V_CC=Min., I_OH=−12 mA
Mil
2.4
3.3
V
V_OL
Output LOW Voltage
V_CC=Min., I_OL=64 mA
Com’l
0.3 0.55
V
V_CC=Min., I_OL=32 mA
Mil
0.3 0.55
V
V_IH
Input HIGH Voltage
2.0
V
V_IL
Input LOW Voltage
V_H
Hysteresis^[6]
All inputs
0.8
V
0.2
V
V_IK
Input Clamp Diode Voltage
V_CC=Min., I_IN=−18 mA
−0.7 −1.2
V
I_I
Input HIGH Current
V_CC=Max., V_IN=V_CC
5
µA
I_IH
Input HIGH Current
V_CC=Max., V_IN=2.7V
±1
µA
I_IL
Input LOW Current
V_CC=Max., V_IN=0.5V
I_OS
Output Short Circuit Current^[7] V_CC=Max., V_OUT=0.0V
±1
µA
−60 −120 −225 mA
I_OFF
Power-Off Disable
V_CC=0V, V_OUT=4.5V
±1
µA
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V_CC or ground.
4. T_A is the “instant on” case temperature.
5. Typical values are at V_CC=5.0V, T_A=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I_OS tests should be performed last.
2