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BQ24081_12 Datasheet, PDF (17/25 Pages) Texas Instruments – 1-A, SINGLE-CHIP, LI-ION AND LI-POL CHARGER IC
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bq24080
bq24081
SLUS698E – MARCH 2006 – REVISED AUGUST 2011
SOURCE
INPUT
VDC
GND
C1
0.1 mF
bq24080
1 IN
OUT 10
1.5 kW
2 GND
CE 9
1.5 kW
PACK+
C2
+
0.1 mF PACK–
1.5 kW
3 STAT1 PG 8
4 STAT2 GND 7
5 VSS
ISET 6
1.13 kW
RSET
Charge Current
Translator Output
Figure 10. Typical Application Circuit
Thermal Considerations
The bq24080 and bq24081 are packaged in a thermally enhanced MLP package. The package includes a
thermal pad to provide an effective thermal contact between the device and the printed-circuit board (PCB). Full
PCB design guidelines for this package are provided in the application report entitled, QFN/SON PCB
Attachment (TI Literature Number SLUA271).
The most common measure of package thermal performance is thermal impedance (RθJA) measured (or
modeled) from the device junction to the air surrounding the package surface (ambient). The mathematical
expression for RθJA is:
RqJA
=
TJ - T
P
A
(5)
Where:
• TJ = device junction temperature
• TA = ambient temperature
• P = device power dissipation
Factors that can greatly influence the measurement and calculation of RθJA include:
• Orientation of the device (horizontal or vertical)
• Volume of the ambient air surrounding the device under test and airflow
• Whether other surfaces are in close proximity to the device being tested
• Use multiple 10–13 mil vias in the PowerPAD™ to copper ground plane.
• Avoid cutting the ground plane with a signal trace near the power IC.
• The PCB must be sized to have adequate surface area for heat dissipation.
• FR4 (figerglass) thickness should be minimized.
The device power dissipation, P, is a function of the charge rate and the voltage drop across the internal Power
FET. It can be calculated from the following equation:
P = (V(IN) - V(OUT)) x IO(OUT)
(6)
Due to the charge profile of Li-xx batteries, the maximum power dissipation is typically seen at the beginning of
the charge cycle when the battery voltage is at its lowest. See Figure 6.
Copyright © 2006–2011, Texas Instruments Incorporated
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