UCC2806 Datasheet, PDF (1/21 Pages) Texas Instruments – LOW-POWER, DUAL-OUTPUT, CURRENT-MODE PWM CONTROLLER

UCC1806
UCC2806
UCC3806
SLUS272C − FEBRUARY 2000 − REVISED JUNE 2003
LOW-POWER, DUALĆOUTPUT,
CURRENTĆMODE PWM CONTROLLER
FEATURES
D BiCMOS Version of UC3846 Family
D 1.4-mA Maximum Operating Current
D 100-µA Maximum Startup Current
D ±0.5-A Peak Output Current
D 125-ns Circuit Delay
D Easier Parallelability
D Improved Benefits of Current Mode Control
DESCRIPTION
The UCC3806 family of BiCMOS PWM controllers
offers exceptionally improved performance with a
familiar architecture. With the same block diagram
and pinout of the popular UC3846 series, the
UCC3806 line features increased switching
frequency capability while greatly reducing the
bias current used within the device. With a typical
startup current of 50 µA and a well defined voltage
threshold for turn-on, these devices are favored
SIMPLIFIED APPLICATION DIAGRAM
for applications ranging from off-line power
supplies to battery operated portable equipment.
Dual high-current, MOSFET driving outputs and a
fast current sense loop further enhance device
versatility.
All the benefits of current mode control including
simpler loop closing, voltage feed-forward,
parallelability with current sharing, pulse-by-pulse
current limiting, and push/pull symmetry
correction are readily achievable with the
UCC3806 series.
These devices are available in multiple package
options for both through-hole and surface mount
applications; and in commercial, industrial, and
military temperature ranges.
The UCC3806 is specified for operation from
−55°C to 125°C, the UCC2806 is specified for
operation from −40°C to 85°C, and the UCC3806
is specified for operation from 0°C to 70°C.
+VIN
15
13
VIN
VC
UCC3806
2 VREF
INV 6
8 CT
COMP 7
5 NI
AOUT 11
1 CURLIM BOUT 14
10 SYNC
SHUT ₁₅
DOWN
9 RT
CS+ 4
CS− GND
3 12
UCC3612
UC39431
+VOUT
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  1999 − 2003, Texas Instruments Incorporated
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