English
Language : 

TXS0104E_08 Datasheet, PDF (1/22 Pages) Texas Instruments – 4-BIT BIDIRECTIONAL VOLTAGE-LEVEL TRANSLATOR FOR OPEN-DRAIN AND PUSH-PULL APPLICATIONS
TXS0104E
www.ti.com............................................................................................................................................................... SCES651D – JUNE 2006 – REVISED MAY 2008
4-BIT BIDIRECTIONAL VOLTAGE-LEVEL TRANSLATOR
FOR OPEN-DRAIN AND PUSH-PULL APPLICATIONS
FEATURES
1
•2 No Direction-Control Signal Needed
• Max Data Rates
– 24 Mbps (Push Pull)
– 2 Mbps (Open Drain)
• Available in the Texas Instruments NanoFree™
Package
• 1.65 V to 3.6 V on A port and 2.3 V to 5.5 V on
B port (VCCA ≤ VCCB)
• No Power-Supply Sequencing Required – VCCA
or VCCB Can Be Ramped First
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– A Port
– 2000-V Human-Body Model (A114-B)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
– B Port
– 15-kV Human-Body Model (A114-B)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
D OR PW PACKAGE
(TOP VIEW)
• IEC 61000-4-2 ESD (B Port)
– ±8-kV Contact Discharge
– ±10-kV Air-Gap Discharge
GXU/ZXU (BGA) PACKAGE
(TOP VIEW)
ABC
4
3
2
1
TERMINAL ASSIGNMENTS
(GXU/ZXU Package)
A
B
C
4
A4
GND
B4
3
A3
OE
B3
2
A2
VCCA
B2
1
A1
VCCB
B1
RGY PACKAGE
(TOP VIEW)
VCCA 1
A1 2
A2 3
A3 4
A4 5
NC 6
GND 7
14 VCCB
13 B1
12 B2
11 B3
10 B4
9 NC
8 OE
NC − No internal connection
1
A1 2
A2 3
A3 4
A4 5
NC 6
7
14
13 B1
12 B2
11 B3
10 B4
9 NC
8
NC − No internal connection
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2008, Texas Instruments Incorporated