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TXB0104_08 Datasheet, PDF (1/25 Pages) Texas Instruments – 4-BIT BIDIRECTIONAL VOLTAGE-LEVEL TRANSLATOR WITH AUTOMATIC DIRECTION SENSING AND ±15-kV ESD PROTECTION
TXB0104
www.ti.com.............................................................................................................................................................. SCES650D – APRIL 2006 – REVISED MAY 2008
4-BIT BIDIRECTIONAL VOLTAGE-LEVEL TRANSLATOR
WITH AUTOMATIC DIRECTION SENSING AND ±15-kV ESD PROTECTION
FEATURES
1
•2 1.2 V to 3.6 V on A Port and 1.65 V to 5.5 V on
B Port (VCCA ≤ VCCB)
• VCC Isolation Feature – If Either VCC Input Is at
GND, All Outputs Are in the High-Impedance
State
• OE Input Circuit Referenced to VCCA
• Low Power Consumption, 5-µA Max ICC
• Ioff Supports Partial-Power-Down Mode
Operation
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
GXU/ZXU PACKAGE
(TOP VIEW)
ABC
4
3
2
1
• ESD Protection Exceeds JESD 22
– A Port
– 2500-V Human-Body Model (A114-B)
– 200-V Machine Model (A115-A)
– 1500-V Charged-Device Model (C101)
– B Port
– ±15-kV Human-Body Model (A114-B)
– 200-V Machine Model (A115-A)
– 1500-V Charged-Device Model (C101)
TERMINAL ASSIGNMENTS
(GXU/ZXU Package)
A
B
C
4
A4
GND
B4
3
A3
OE
B3
2
A2
VCCA
B2
1
A1
VCCB
B1
D OR PW PACKAGE
(TOP VIEW)
VCCA 1
A1 2
A2 3
A3 4
A4 5
NC 6
GND 7
14 VCCB
13 B1
12 B2
11 B3
10 B4
9 NC
8 OE
RGY PACKAGE
(TOP VIEW)
A1 2
A2 3
A3 4
A4 5
NC 6
1
14
13 B1
Exposed
Center
Pad
12 B2
11 B3
10 B4
9 NC
7
8
N.C. − No internal connection
For RGY, if the exposed center pad is used it must only be connected to as a secondary ground or left electrically
open.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2008, Texas Instruments Incorporated