TS5A3157 Datasheet, PDF (1/26 Pages) Texas Instruments – 10-ohm SPDT ANALOG SWITCH

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FEATURES
• Low ON-State Resistance (10 Ω)
• Control Inputs Are 5-V Tolerant
• Low Charge Injection
• Excellent ON-State Resistance Matching
• Low Total Harmonic Distortion (THD)
• 1.65-V to 5.5-V Single-Supply Operation
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Performance Tested Per JESD 22
– 2000-V Human-Body Model
(A114-B, Class II)
– 1000-V Charged-Device Model (C101)
TS5A3157
10-Ω SPDT ANALOG SWITCH
SCDS199 – JUNE 2005
APPLICATIONS
• Sample-and-Hold Circuits
• Battery-Powered Equipment
• Audio and Video Signal Routing
• Communication Circuits
SOT-23 OR SC-70 PACKAGE
(TOP VIEW)
NO 1
GND 2
NC 3
TS5A3157
6 IN
5 V₊
4 COM
DESCRIPTION/ORDERING INFORMATION
The TS5A3157 is a single-pole double-throw (SPDT) analog switch that is designed to operate from 1.65 V to
5.5 V. This device can handle both digital and analog signals, and signals up to V₊ can be transmitted in either
direction.
SUMMARY OF CHARACTERISTICS
V₊ = 5 V and T_A = 25°C
Configuration
Single Pole
Double Throw
(SPDT)
Number of channels
1
ON-state resistance (r_on)
ON-state resistance match (∆r_on)
ON-state resistance flatness (r_on(flat))
Turn-on/turn-off time (t_ON/t_OFF)
Break-before-make time (t_BBM)
Charge injection (Q_C)
Bandwidth (BW)
10 Ω
0.15 Ω
4Ω
5.7 ns/3.8 ns
0.5 ns
7 pC
300 MHz
OFF isolation (O_ISO)
Crosstalk (X_TALK)
Total harmonic distortion (THD)
–65 dB at 10 MHz
–66 dB at 10 MHz
0.01%
Leakage current (I_NO(OFF)/I_NC(OFF))
Power-supply current (I₊)
Package options
±0.1 µA
10 µA
6-pin SOT-23, SC-70,
DSBGA
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005, Texas Instruments Incorporated