English
Language : 

TPS76815Q Datasheet, PDF (1/22 Pages) Texas Instruments – FAST-TRANSIENT-RESPONSE 1-A LOW-DROPOUT VOLTAGE REGULATORS
www.ti.com
TPS76815Q, TPS76818Q, TPS76825Q
TPS76827Q, TPS76828Q, TPS76830Q
TPS76833Q, TPS76850Q, TPS76801Q
SLVS211J – JUNE 1999 – REVISED OCTOBER 2004
FAST-TRANSIENT-RESPONSE 1-A LOW-DROPOUT VOLTAGE REGULATORS
FEATURES
• 1 A Low-Dropout Voltage Regulator
• Available in 1.5-V, 1.8-V, 2.5-V, 2.7-V, 2.8-V,
3.0-V, 3.3-V, 5.0-V Fixed Output and
Adjustable Versions
• Dropout Voltage Down to 230 mV at 1 A
(TPS76850)
• Ultralow 85 µA Typical Quiescent Current
• Fast Transient Response
• 2% Tolerance Over Specified Conditions for
Fixed-Output Versions
• Open Drain Power Good (See TPS767xx for
Power-On Reset With 200-ms Delay Option)
• 8-Pin SOIC and 20-Pin TSSOP (PWP) Package
• Thermal Shutdown Protection
DESCRIPTION
This device is designed to have a fast transient
response and be stable with 10µF low ESR capaci-
tors. This combination provides high performance at a
reasonable cost.
TPS76833
DROPOUT VOLTAGE
vs
FREE-AIR TEMPERATURE
103
IO = 1 A
102
101
IO = 10 mA
100
10-1
Co = 10 µF
IO = 0
10-2
-60 -40 -20 0 20 40 60 80 100 120 140
TA - Free-Air Temperature - °C
PWP PACKAGE
(TOP VIEW)
GND/HSINK 1
GND/HSINK 2
GND 3
NC 4
EN 5
IN 6
IN 7
NC 8
GND/HSINK 9
GND/HSINK 10
20 GND/HSINK
19 GND/HSINK
18 NC
17 NC
16 PG
15 FB/NC
14 OUT
13 OUT
12 GND/HSINK
11 GND/HSINK
NC − No internal connection
D PACKAGE
(TOP VIEW)
GND 1
EN 2
IN 3
IN 4
8 PG
7 FB/NC
6 OUT
5 OUT
100
50
0
-50
-100
1
0.5
0
LOAD TRANSIENT RESPONSE
Co = 10 µF
TA = 25°C
0 100 200 300 400 500 600 700 800 900 1000
t - Time - µs
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2004, Texas Instruments Incorporated