TPS75801 Datasheet, PDF (1/24 Pages) Texas Instruments – FAST-TRANSIENT RESPONSE 3-A LOW-DROPOUT VOLTAGE REGULATORS

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TPS75801, TPS75815
TPS75818, TPS75825
TPS75833
SLVS330D – JUNE 2001 – REVISED MARCH 2004
FAST-TRANSIENT RESPONSE 3-A LOW-DROPOUT VOLTAGE REGULATORS
FEATURES
• 3-A Low-Dropout Voltage Regulator
• Available in 1.5-V, 1.8-V, 2.5-V, and 3.3-V
Fixed-Output and Adjustable Versions
• Dropout Voltage Typically 150 mV at 3 A
(TPS75833)
• Low 125 µA Typical Quiescent Current
• Fast Transient Response
• 3% Tolerance Over Specified Conditions for
Fixed-Output Versions
• Available in 5-Pin TO-220 and TO-263
Surface-Mount Packages
• Thermal Shutdown Protection
EN
IN
GND
OUTPUT
FB/NC
TO–220 (KC) PACKAGE
(TOP VIEW)
1
2
3
4
5
DESCRIPTION
The TPS758xx family of 3-A low dropout (LDO)
regulators contains four fixed voltage option regu-
lators and an adjustable voltage option regulator.
These devices are capable of supplying 3 A of output
current with a dropout of 150 mV (TPS75833).
Therefore, the device is capable of performing a
3.3-V to 2.5-V conversion.
Quiescent current is 125 µA at full load and drops
down to less than 1 µA when the device is disabled.
The TPS758xx is designed to have fast transient
response for large load current changes.
TO–263 (KTT) PACKAGE
(TOP VIEW)
EN
1
IN
2
GND
3
OUTPUT
4
FB/NC
5
TPS75833
DROPOUT VOLTAGE
vs
JUNCTION TEMPERATURE
250
I_O = 3 A
V_O = 3.3 V
200
150
100
50
TPS75815
LOAD TRANSIENT RESPONSE
150
V_O = 1.5 V
100 C_o = 100 µF
50
0
–50
–100
di 0.75 A
dt ^{+ ms}
–150
3
0
–40 –25 –10 5 20 35 50 65 80 95 110 125
T_J – Junction Temperature – °C
0
0 20 40 60 80 100 120 140 160 180 200
t – Time – µs
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2001–2004, Texas Instruments Incorporated