TPS75525 Datasheet, PDF (1/27 Pages) Texas Instruments – FAST-TRANSIENT RESPONSE 5-A LOW-DROPOUT VOLTAGE REGULATORS

TPS75515, TPS75518, TPS75525, TPS75533 WITH POWER GOOD AND
TPS75501 FAST-TRANSIENT RESPONSE 5-A LOW-DROPOUT
VOLTAGE REGULATORS
SLVS293D – NOVEMBER 2000 – REVISED MAY 2002
D 5-A Low-Dropout Voltage Regulator
D Available in 1.5-V, 1.8-V, 2.5-V, and 3.3-V
Fixed-Output and Adjustable Versions
D Open Drain Power-Good (PG) Status
Output (Fixed Options Only)
D Dropout Voltage Typically 250 mV at 5 A
(TPS75533)
D Low 125 µA Typical Quiescent Current
D Fast Transient Response
D 3% Tolerance Over Specified Conditions for
Fixed-Output Versions
D Available in 5-Pin TO–220 and TO–263
Surface-Mount Packages
D Thermal Shutdown Protection
EN
IN
GND
OUTPUT
FB/PG
TO–220 (KC) PACKAGE
(TOP VIEW)
1
2
3
4
5
Tab is GND
TO–263 (KTT) PACKAGE
(TOP VIEW)
EN
1
IN
2
GND
3
OUTPUT
4
FB/PG
5
Tab is GND
description
The TPS755xx family of 5-A low dropout (LDO) regulators contains four fixed voltage option regulators with
integrated power-good (PG) and an adjustable voltage option regulator. These devices are capable of supplying
5 A of output current with a dropout of 250 mV (TPS75533). Therefore, the device is capable of performing a
3.3-V to 2.5-V conversion. Quiescent current is 125 µA at full load and drops down to less than 1 µA when the
device is disabled. The TPS755xx is designed to have fast transient response for large load current changes.
TPS75533
DROPOUT VOLTAGE
vs
JUNCTION TEMPERATURE
400
IO = 5 A
350 ^{VO = 3.3 V}
TPS75515
LOAD TRANSIENT RESPONSE
150
VO = 1.5 V
100 ^{Co = 100 µF}
300
50
250
0
200
–50
150
–100
di
dt
+
1.25
µs
A
100
–150
5
50
0
0
–40 –25 –10 5 20 35 50 65 80 95 110 125
TJ – Junction Temperature – °C
0 20 40 60 80 100 120 140 160 180 200
t – Time – µs
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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