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TPS65137ADSCR Datasheet, PDF (1/22 Pages) Texas Instruments – 200mA Dual Output AMOLED Display Power
TPS65137
www.ti.com
SLVS929A – MAY 2010 – REVISED OCTOBER 2012
200mA Dual Output AMOLED Display Power
Check for Samples: TPS65137
FEATURES
1
• 2.3 V to 5.5 V Input Voltage Range
• 1% Output Voltage Accuracy VPOS
• Excellent Line Transient Regulation
• Low Noise Operation
• 200 mA Output Current
• Fixed 4.63 V Positive Output Voltage
• Digitally Programmable Negative Output
Voltage Down to –5.23V
• –4.93V Default Value for VNEG
• Advanced Power Save Mode
• Short Circuit Protection
• Thermal Shutdown
• TPS65137A High impedance output in
shutdown
• 3×3 mm 10 Pin QFN Package
DESCRIPTION
The TPS65137 is designed to provide best in class
picture quality for AMOLED displays (Active Matrix
Organic Light Emitting Diode) requiring positive and
negative voltage supply rails. With its wide input
voltage range the device is ideally suited for
AMOLED displays, which are used in mobile phones
and smart phones. With this device the input voltage
can be higher than the positive output voltage and
still maintains accurate regulation of VPOS. Using the
digital control pin (CTRL) allows adjusting the
negative output voltage in digital steps. The
TPS65137 uses a novel technology enabling
excellent line and load regulation with minimum
output voltage ripple by using a LDO post regulator
for VPOS. This is required avoiding disturbance of the
AMOLED display due to input voltage transients
occurring during transmit periods in mobile phones.
APPLICATIONS
• Active Matrix OLED Power Supply
TYPICAL APPLICATION
VIN
2.3V to 5.5V
C1
4.7mF
Enable and
Digital OUTN
Adjustment
C4
100nF
L1
4.7mH
L2
4.7mH
C2
2.2mF
VPOS
4.63V/200mA
C5
4.7mF
C6
4.7mF
VNEG
-4.93V/200mA
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010–2012, Texas Instruments Incorporated