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TPS61045 Datasheet, PDF (1/20 Pages) Texas Instruments – DIGITALLY ADJUSTABLE LCD BOOST CONVERTER
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TPS61045
SLVS440A – JANUARY 2003 – REVISED SEPTEMBER 2003
DIGITALLY ADJUSTABLE LCD BOOST CONVERTER
FEATURES
DESCRIPTION
• Input Voltage Range . . . 1.8 V to 6.0 V
• Up to 85% Efficiency
• Digitally Adjustable Output Voltage Control
• Disconnects Output From Input During Shut-
down
• Switching Frequency . . . Up to 1 MHz
• No Load Quiescent Current . . . 40 µA Typ
• Thermal Shutdown Mode
• Shutdown Current . . . 0.1 µA Typ
• Available in Small 3mm × 3mm QFN package
APPLICATIONS
The TPS61045 is a high frequency boost converter with
digitally programmable output voltage and true shut-
down. During shutdown the output is disconnected
from the input by opening the internal input switch. This
allows a controlled power up/down sequencing of the
display. The output voltage can be increased or de-
creased in digital steps by applying a logic signal to the
CTRL pin. The output voltage range, as well as the
output voltage step size, can be programmed with the
feedback divider network. With a high switching fre-
quency of up to 1 MHz the TPS61045 allows the use of
small external components and together, with the small
8-pin QFN package, a miminum system solution size is
achieved.
• LCD Bias Supply For Small to Medium LCD
Displays
• OLED Display Power Supply
– PDA, Pocket PC, Smart Phones
– Handheld Devices
– Cellular Phones
VCC = 1.8 V to 6 V
C1
100 nF
L1
4.7 mH
D1
MBR0530
C2
4.7uF
1L
SW 8
2 VIN
DO 3
5 CTRL
4
FB
6 GND PGND 7
R1
2.2 MW
R3
1 MW
R2
180 kW
VO
16.2 V to 18.9 V/ 10 mA
Cff
22 pF
C3
1 mF
Enable / LCD bias control
Figure 1. Typical Application
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily in-
clude testing of all parameters.
Copyright © 2003, Texas Instruments Incorporated