TPS5510 Datasheet, PDF (1/6 Pages) Texas Instruments – 3-CHANNEL POWER SUPPLY SUPERVISOR

TPS5510
3-CHANNEL POWER SUPPLY SUPERVISOR
D Over Voltage Protection and Lock Out for
5 V, 3.3 V, and 12 V
D Under Voltage Protection and Lock Out for
5 V and 3.3 V
D Fault Protection Output with Open Drain
Output Stage
D Open Drain Power Good Output Signal for
Power Good Input, 5 V and 3.3 V
D 300 ms Power Good Delay
D 75 ms Delay for 5-V and 3.3-V Short-Circuit
Turn On Protection
D 38 ms PSON Control Debounce
D 73 µs Width Noise Deglitches
D Wide Power Supply Voltage Range
from 4 V to 15 V
SLVS168 – JULY 1998
D OR P PACKAGE
(TOP VIEW)
PGI 1
GND 2
FPO 3
PSON 4
8 PGO
7 V_CC
6 VS5
5 VS33
description
The TPS5510 is designed to minimize external components of personal computer switching power supply
systems. It provides protection circuits, power good indicator, fault protection output (FPO), and a PSON control.
OVP (Over Voltage Protection) monitors 5 V, 3.3 V, and 12 V (12 V OV detects via V_CC terminal). UVP (Under
Voltage Protection) monitors 5 V and 3.3 V. When an OV or UV condition is detected, the PGO (power good
output) is asserted low and FPO is latched high. PSON from low to high resets the protection latch. UVP function
will be enabled 75 ms after PSON is set low and debounced.
Power good feature monitors PGI, 5 V and 3.3 V and issues a power good signal when they are ready.
The TPS5510 is characterised for operation from T_J = –40°C to 125°C junction temperature.
PGI
5 VSB
PSON
TPS5510
1
PGI
8
PGO
2
GND
3
FPO
7
VCC
6
VS5
4
PSON
5
VS33
0.5 V
Drop
PGO
12 V
VSB
5V
3.3 V
Figure 1. TPS5510 Typical Application
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1998, Texas Instruments Incorporated
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