TPS40101_15 Datasheet, PDF (1/37 Pages) Texas Instruments – MIDRANGE INPUT SYNCHRONOUS BUCK CONTROLLER WITH ADVANCED SEQUENCING AND OUTPUT MARGINING

TPS40101
www.ti.com
SLUS726 – SEPTEMBER 2006
MIDRANGE INPUT SYNCHRONOUS BUCK CONTROLLER
WITH ADVANCED SEQUENCING AND OUTPUT MARGINING
FEATURES
• Operation over 4.5 V to 18 V Input Range
• 100 kHz to 1 MHz Voltage Mode Control
• Output Voltage Range From 0.69 V to 5.5 V
• Simultaneous, Ratiometric and Sequential
Startup Sequencing
• Remote Sensing (Via Separate GND/PGND)
• 24-Pin QFN Package
• Thermal Shutdown
• Programmable Overcurrent Protection
• Power Good Indicator
• 1%, 690-mV Reference
• Output Margining, 3% and 5%
• Programmable UVLO and Hysteresis
• Frequency Synchronization
APPLICATIONS
• Servers
• Networking Equipment
• Telecommunications Equipment
• Power Supply Modules
CONTENTS
Device Ratings
2
Electrical Characteristics
3
Terminal Information
5
Typical Characteristics
8
Application Information
15
Design Example
29
Additional References
30
DESCRIPTION
The TPS40101 is a wide-input synchronous,
step-down controller that offers programmable closed
loop soft-start, programmable UVLO and hysteresis,
programmable current limit with hiccup recovery and
can be synchronized to other timebases. The
TPS40101 incorporates MOSFET gate drivers for
external N-channel MOSFETs. Gate drive logic
incorporates adaptive anti-cross conduction circuitry
for improved efficiency, reducing diode conduction in
the rectifier MOSFET.
TYPICAL APPLICATION
VTRKN
VIN
24 23 22 21 20 19
1 COMP
VDD 18
2 FB
SW 17
3 TRKOUT
4 TRKIN
TPS40101
HDRV 16
BST 15
5 UVLO
5VBP 14
6 ILIM
LDRV 13
7 8 9 10 11 12
UDG−06054
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated