TPS2836 Datasheet, PDF (1/14 Pages) Texas Instruments – SYNCHRONOUS-BUCK MOSFET DRIVER WITH DEADTIME CONTROL

D Floating Bootstrap or Ground-Reference
High-Side Driver
D Active Deadtime Control
D 50-ns Max Rise/Fall Times With 3.3-nF Load
D 2-A Min Peak Output Current
D 4.5-V to 15-V Supply Voltage Range
D TTL-Compatible Inputs
D Internal Schottky Bootstrap Diode
D Low Supply Current . . . 3 mA Typ
D Ideal for High-Current Single- or Multiphase
Applications
D –40°C to 125°C Junction-Temperature
Operating Range
TPS2836, TPS2837
SYNCHRONOUS-BUCK MOSFET DRIVER
WITH DEADTIME CONTROL
SLVS224 – NOVEMBER 1999
D PACKAGE
(TOP VIEW)
IN
1
PGND
2
DT
3
V_CC
4
8
BOOT
7
HIGHDR
6
BOOTLO
5
LOWDR
description
The TPS2836 and TPS2837 are MOSFET drivers for synchronous-buck power stages. These devices are ideal
for designing a high-performance power supply using a switching controller that does not include suitable
on-chip MOSFET drivers. The drivers are designed to deliver minimum 2-A peak currents into large capacitive
loads. The high-side driver can be configured as ground-reference or as floating-bootstrap. An adaptive
dead-time control circuit eliminates shoot-through currents through the main power FETs during switching
transitions and provides high efficiency for the buck regulator.
The TPS2836 has a noninverting input, while the TPS2837 has an inverting input. These drivers, available in
8-terminal SOIC packages, operate over a junction temperature range of –40°C to 125°C.
AVAILABLE OPTIONS
PACKAGED DEVICES
TJ
SOIC
(D)
–40°C to 125°C
TPS2836D
TPS2837D
The D package is available taped and reeled. Add R
suffix to device type (e.g., TPS2836DR)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1999, Texas Instruments Incorporated
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