TPIC1504 Datasheet, PDF (1/16 Pages) Texas Instruments – QUAD AND HEX POWER DMOS ARRAY

TPIC1504
QUAD AND HEX POWER DMOS ARRAY
SLIS057 – OCTOBER 1996
D Low r_DS(on):
0.25 Ω Typ (Full H-Bridge)
DW PACKAGE
(TOP VIEW)
0.15 Ω Typ (Triple Half H-Bridge)
D Pulsed Current:
6 A Per Channel (Full H-Bridge)
8 A Per Channel (Triple Half H-Bridge)
D Matched Sense Transistor for Class A-B
Linear Operation
OUTPUT1 ₁
GATE2C ₂
GATE1B ₃
GATE3B 4
GND 5
OUTPUT3 6
24 ^GATE3A
23 ^GATE1A
22 ^GATE4A
21 V_DD1
20 V_DD3
19 OUTPUT4
D Fast Commutation Speed
SOURCE 7
OUTPUT5 8
18 V_DD3
17 GATE5A
description
GND 9
GATE4B 10
16 V_DD2
15 GATE2A
The TPIC1504 is a monolithic power DMOS array
GATE2B 11 14 SENSE
that consists of ten electrically isolated N-channel
enhancement-mode power DMOS transistors,
GATE5B 12 13 OUTPUT2
four of which are configured as a full H-bridge and six as a triple half H-bridge. The lower stage of the full H-bridge
is provided with an integrated sense-FET to allow biasing of the bridge in class A-B operation.
The TPIC1504 is offered in a 24-pin wide-body surface-mount (DW) package and is characterized for operation
over the case temperature range of – 40°C to 125°C.
schematic
VDD1
21
VDD2
16
VDD3
18, 20
Q1A
23
GATE1A
1
OUTPUT1
D1
Q1B
3
GATE1B
Q2A
15
Q3A
24
GATE2A
GATE3A
13
6
D2
OUTPUT2
OUTPUT3
Q2B
11
Q3B
4
GATE2B
GATE3B
SENSE ¹⁴
Q2C
2
GATE2C
6V
5, 9
GND
NOTES: A. Terminals 5 and 9 must be externally connected.
B. Terminals 18 and 20 must bef externally connected.
C. No output may be taken greater than 0.5 V below GND.
D3
7
SOURCE
Q4A
22
GATE4A
19
OUTPUT4
Q4B
10
GATE4B
Q5A
17
GATE5A
8
OUTPUT5
Q5B
12
GATE5B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1996, Texas Instruments Incorporated
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