TPIC1501A Datasheet, PDF (1/17 Pages) Texas Instruments – QUAD AND HEX POWER DMOS ARRAY

TPIC1501A
QUAD AND HEX POWER DMOS ARRAY
SLIS046A – MAY 1995 – REVISED JUNE 1996
D Low r_DS(on):
0.1 Ω Typ (Full H-Bridge)
0.4 Ω Typ (Triple Half H-Bridge)
D Pulsed Current:
12 A Per Channel (Full H-Bridge)
6 A Per Channel (Triple Half H-Bridge)
D Matched Sense Transistor for Class A-B
Linear Operation
D Fast Commutation Speed
description
The TPIC1501A is a monolithic power array that
consists of ten electrically isolated N-channel
enhancement-mode power DMOS transistors, four
of which are configured as a full H-bridge and six as
a triple half H-bridge. The lower stage of the full
H-bridge features an integrated sense FET to allow
biasing of the bridge in class A-B operation.
DW PACKAGE
(TOP VIEW)
OUTPUT3 ₁
GND ₂
GATE3B ₃
GATE2B 4
SENSE 5
OUTPUT2 6
GATE4B 7
GATE2A 8
GATE5B 9
V_DD2 10
OUTPUT4 11
SOURCE 12
24 ^V_DD3
23 ^GND
22 ^GATE3A
21 GATE1B
20 GATE2C
19 OUTPUT1
18 GATE4A
17 GATE1A
16 GATE5A
15 V_DD1
14 V_DD3
13 OUTPUT5
The TPIC1501A is offered in a 24-pin wide-body surface-mount (DW) package and is characterized for
operation over the case temperature range of – 40°C to 125°C.
schematic
VDD1
15
VDD2
10
VDD3
14, 24
Q1A
17
GATE1A
19
OUTPUT1
D1
Q1B
21
GATE1B
SENSE ⁵
Q2C
20
GATE2C
Q2A
8
Q3A
22
Q4A
18
GATE2A
GATE3A
GATE4A
6
1
11
D2
OUTPUT2 OUTPUT3
D3 _OUTPUT4
Q2B
4
GATE2B
Q3B
3
GATE3B
Q4B
7
GATE4B
12
SOURCE
Q5A
16
GATE5A
13
OUTPUT5
Q5B
9
GATE5B
2, 23
GND
NOTES: A. Pins 2 and 23 must be externally connected.
B. Pins 14 and 24 must be externally connected.
C. No output may be taken greater than 0.5 V below GND.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1996, Texas Instruments Incorporated
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